Anritsu MP1777A Manual do Utilizador descarregar pdf (Página 13)

Wander Conforming to ITU-T Rec. G.823/G.824/G.825

Since MP1570A can generate wander [up to 57,600 UIp-p/10 µHz

(at 2488M)], jitter and wander tolerance mask evaluation

conforming to ITU-T Rec. G.823/G.824/G.825 is possible.

(usable wander tolerance mask at manual measurements)

Various wander application software

It is possible to perform MTIE and TDEV measurements on

real time by MX150001B wander application and external PC.

Various wander measurements can also be performed, such as

hold over, wander tolerance (TDEV), and wander transfer

characteristics (TDEV).

Real time wander measurement: Real time wander

measurements, such as frequency offset, frequency drift rate,

MTIE, TIE, and TDEV

Wander tolerance (TDEV) measurement: Evaluates the

wander tolerance by TDEV wander modulation

Wander transfer (TDEV) measurement: Evaluates the wander

transfer characteristics by TDEV wander modulation

[GPIB or RS-232C]

MX150001B

Wander (MTIV, TDEV)

Measurement Application

Software

CSM: Clock Supply Module

NE: SDH/SONET Network Element

MP1570A

SDH/SONET data

1.5 MHz signal

Wander

reference input

SDH/

SONET

network

CSM

MTIE/TDEV Measurement

MTIE/TDEV analysis can be performed by running the MX150001B

Application Software on an external personal computer. Data

collected in the field can be saved to floppy disk and taken to

the office for easy analysis and

management on a computer.

f0 f12 f11 f10 f9 f8

Jitter or wander amplitude (p-p)

Slope:20 dB/decade

Jitter frequency

1 2 ... 8 9 10 11 12 13 14 15 16 17 18 ... 38 39

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