Anritsu 682XXB Manual do Utilizador

Consulte online ou descarregue Manual do Utilizador para Geradores Anritsu 682XXB. Anritsu 682XXB User Manual Manual do Utilizador

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SERIES
682XXB/683XXB
SYNTHESIZED SIGNAL GENERATORS
MAINTENANCE MANUAL
P/N: 10370-10290
REVISION: H
PRINTED: AUGUST 2003
COPYRIGHT 2003 ANRITSU CO.
490 JARVIS DRIVE
MORGAN HILL, CA 95037-2809
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Resumo do Conteúdo

Página 1 - MAINTENANCE MANUAL

SERIES682XXB/683XXBSYNTHESIZED SIGNAL GENERATORSMAINTENANCE MANUALP/N: 10370-10290REVISION: HPRINTED: AUGUST 2003COPYRIGHT 2003 ANRITSU CO.490 JARVIS

Página 2 - TRADEMARK ACKNOWLEDGEMENTS

6-5 REMOVING AND REPLACING THE A7 PCB...6-10Preliminary...6-10Procedure...6-106-6 REMOVING AND REPLACING THE A8, A9, A1

Página 3

Rise/FallTime andOvershootThe following procedure lets you measure the risetime, fall time, and overshoot parameters of thepulse modulation waveform.1

Página 4

PulseLevelingAccuracyThe following procedure lets you measure the pulsedRF output level and CW output level and comparethem to verify pulse leveling a

Página 5 - Table Of Contents

3. On the 682XXB/683XXB:a.Press MODULATION , then Pulse to go to theInternal Pulse Status Menu display.b.Press Edit Width and set W1 to the pulsewidth

Página 6

3-15 PULSE MODULATIONTEST: VIDEOFEEDTHROUGHThis pulse modulation test verifies that video feedthrough is withinspecifications.Test SetupConnect the eq

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TestProcedureThe following procedure lets you measure the videofeedthrough that occurs during pulse modulation.1. Set up the 682XXB/683XXB as follows:

Página 8 - Chapter 4 - Calibration

3-16 PULSE MODULATIONTEST: RF ON/OFFRATIOThis pulse modulation test verifies that the ratio of RF on power to RFoff power is within specifications.Tes

Página 9 - Chapter5-Troubleshooting

e. Press More to go to the additional InternalPulse Status Menu display.g. Press Internal/External to select the externalsource for the modulation sig

Página 10 - Table of Contents (Continued)

7. Repeat steps 1 through 6 for any other frequen-cies noted on the Test Record. Record the resultson the Test Record.682XXB/683XXB MM 3-47PERFORMANCE

Página 11 - General Information

3-17 PHASE MODULATIONTESTSThis procedure verifies the operation of the phase modulation (FM) in-put sensitivity circuits in 682XXB/683XXBs with Option

Página 12

WIDE FM Mode1. Set up the 682XXB/683XXB as follows:a.Reset the instrument by pressing SYSTEM ,then Reset . Upon reset, the CW Menu is dis-played.b.Pre

Página 13

Table of Contents1-1 SCOPE OF MANUAL...1-31-2 INTRODUCTION...1-31-3 DESCRIPTION...1-31-4 IDENTIFICATION

Página 14 - INFORMATION MODELS

Narrow FM Mode1. Set up the 682XXB/683XXB as follows:a.Reset the instrument by pressing SYSTEM ,then Reset . Upon reset, the CW Menu is dis-played.b.P

Página 15 - 1-4 IDENTIFICATION

Table of Contents4-1 INTRODUCTION...4-34-2 RECOMMENDED TEST EQUIPMENT...4-34-3 TEST RECORDS ...4-34-4 CALIBRATION

Página 16 - INFORMATION MANUAL

ALC Slope DAC Adjustment...4-284-11 ALC BANDWIDTH CALIBRATION...4-31Equipment Setup...4-31Bandwidth Calibration...4

Página 17 - INFORMATION

Chapter 4Calibration4-1 INTRODUCTION This chapter contains procedures for calibrating the Series 682XXB/683XXB Synthesized Signal Generators. These pr

Página 18 - 1-8 LEVEL OF

4-4 CALIBRATIONFOLLOWINGSUBASSEMBLYREPLACEMENTTable 4-2 (page 4-6) lists the calibration that should be performed fol-lowing the replacement of 682XXB

Página 19 - 1-10 STATIC-SENSITIVE

682XXB/683XXB MM 4-5RECOMMENDEDCALIBRATION TEST EQUIPMENTINSTRUMENTCRITICALSPECIFICATIONRECOMMENDEDMANUFACTURER/MODELPROCEDURENUMBERScalar NetworkAnal

Página 20 - 1-10 682XXB/683XXB MM

4-6 682XXB/683XXB MMSubassembly/RF Component ReplacedPerform the FollowingCalibration(s) in Paragraph(s):A1, A2 Front Panel Assy NoneA3 Reference Loop

Página 21 - 1-11 STARTUP

4-6 INITIAL SETUP The 682XXB/683XXB is calibrated using an IBM compatible PC andexternal test equipment. The PC must have the Windows 3.1 or Win-dows

Página 22 - 1-12 RECOMMENDED TEST

PC Setup —Windows 3.1Configure the PC with Windows 3.1 operating sys-tem to interface with the 682XXB/683XXB as fol-lows:1. Power up the 682XXB/683XXB

Página 23 - INFORMATION TEST EQUIPMENT

5. Click on Communications.6. At the Communications Dialog box, select the fol-lowing options:Baud Rate 9600 (See Note)Data Bits 8Stop Bits 1Parity No

Página 24 - 1-14 REPLACEABLE

Figure 1-1. Typical Series 682XXB/683XXB Synthesized Signal Generator (Model 68369B Shown)

Página 25 - INFORMATION PARTS LIST

7. After making the selections, click on the OK but-ton.8. Press <ENTER> on the keyboard.9.Verify that a $ prompt appears on the PC display.10.

Página 26

7. In the New Connection Name box, type a namefor the connection, then click on the OK button.The window below is now displayed.8.In the Connect using

Página 27

10. In the Properties window, make the following se-lections:Bits per second 19200 (See Note)Data bits 8Parity NoneStop bits 1Flow control Xon / Xoff1

Página 28 - GENERAL ANRITSU

4-7 PRELIMINARYCALIBRATIONThis procedure provides the steps necessary to initially calibrate thecoarse loop, fine loop, frequency instruction, and int

Página 29 - Functional Description

CalibrationStepsEach of the steps in this procedure provides initialcalibration of a specific 682XXB/683XXB circuit orcomponent. To ensure accurate in

Página 30

6. Calibrate the YIG Frequency Linearizer DACs asfollows:a.At the$ prompt, type: calterm 127 andpress <ENTER>.b. Follow the instructions on the

Página 31

10. Calibrate the Center Frequency DAC as follows:a.At the$ prompt, type: calterm 114 andpress <ENTER>. (The$ prompt will appear onthe screen wh

Página 32 - DESCRIPTION MAJOR SUBSYSTEMS

4-8 SWITCHED FILTERSHAPER CALIBRATIONThis procedure provides the steps necessary to adjust the SwitchedFilter Shaper Amplifier gain to produce a more

Página 33

Log AmplifierZero Calibra-tionBefore the Switched Filter Shaper Amplifier can beadjusted, zero calibration of the ALC Log amplifiermust be performed t

Página 34

2. Adjust the Switched Filter Limiter DAC for eachof the frequency bands as follows:a.At the$ prompt on the PC display, type:calterm 145 and press <

Página 35

Chapter 1General Information1-1 SCOPE OF MANUAL This manual provides service information for all models of the Series682XXB/683XXB Synthesized Signal

Página 36

c. Press CHANNEL 2 DISPLAY: OFF.d. Press CHANNEL 1 DISPLAY: ON.e. Press CHANNEL 1 MENU key.f. From the Channel 1 Menu display, selectPOWER.g. Press OF

Página 37 - DESCRIPTION SYNTHESIS

Shaper DACAdjustmentFor Models 682XXB with Firmware Version2.39 and above; Models 683XXB with FirmwareVersion 2.46 and above; Models 682X5B withFirmwa

Página 38

4-9 RF LEVEL CALIBRATION RF level calibration requires the use of an automated test system. Acomputer-controlled power meter measures the 682XXB/683XX

Página 39

4-10 ALC SLOPECALIBRATIONModels 683XXB with Firmware Version 1.01 to 2.00This procedure provides the steps necessary to perform ALC Slopecalibration.

Página 40

NOTEBefore beginning this calibration proce-dure, always let the 683XXB warmup for aminimum of one hour.ALC SlopeDACAdjustmentThe following procedure

Página 41

3. Make the following selections on the 562 NetworkAnalyzer to normalize the step sweep.a. Press CALIBRATION and follow the menu onthe display.b. Pres

Página 42

f. Press Sweep Ramp . At the resulting StepSweep Ramp Menu, press Num of Steps andset the number of steps to 200.g. Press Step to return to the Step S

Página 43 - 2-4 ALC/AM/PULSE

Models 683XXB with Firmware Version 2.00 and above(Models 683X5B with Firmware Version 1.00 and above)This procedure provides the steps necessary to p

Página 44 - DESCRIPTION MODULATION

NOTEBefore beginning this calibration proce-dure, always let the 682XXB/683XXBwarm up for a minimum of one hour.ALC SlopeDACAdjustmentThe following pr

Página 45

d. Press CW/SWEEP SELECT to return to theStep Sweep Menu display.e.Press Sweep Ramp . At the resulting StepSweep Ramp Menu, press Num of Steps andset

Página 46

1-4 682XXB/683XXB MMGENERAL 682XXB/683XXBINFORMATION MODELS68XXXBModelFrequency(GHz)Output PowerOutput Powerw/Step Attenuator68X37B 2.0 – 20.0 GHz +13

Página 47 - DESCRIPTION ASSEMBLIES

b. Adjust the ALC Slope so that the power at thestart and stop frequencies (of the analog sweepfor band 0) match as closely as possible thenormalized

Página 48

4-11 ALC BANDWIDTHCALIBRATIONThis procedure provides the steps necessary to perform ALC Band-width calibration. The ALC Bandwidth is adjusted to compe

Página 49

The $ prompt will appear on the screen whenthe ALC Bandwidth calibration is complete.(This can take up to 15 minutes depending onthe frequency range o

Página 50

4-12 AM CALIBRATION This procedure provides the steps necessary to perform AM calibra-tion. This consists of calibrating the AM Calibration DAC, the A

Página 51

4. Using the K (male) to 2.4 mm (female) adapter,connect the Power Sensor to the RF OUTPUT ofthe 682XXB/683XXB.NOTEBefore beginning this calibration p

Página 52

e.When the DAC has been adjusted, pressQ onthe keyboard to exit the program. (If the in-strument has a Down Converter installed, youwill be returned t

Página 53

5. Perform AM Function Generator calibration asfollows:a.At the$ prompt, type: calterm 146 andpress <ENTER>. (The$ prompt will appear onthe scre

Página 54

4-13 FM CALIBRATIONModels 682XXB/683XXB with Firmware Versions 1.01 to 2.10Models 682X5B/683X5B with Firmwave Version 1.00This procedure provides the

Página 55

4. Connect the 682XXB/683XXB RF OUTPUT to theSpectrum Analyzer RF Input.NOTEBefore beginning this calibration proce-dure, always let the 682XXB/683XXB

Página 56

Perform the calibration as follows:a.At the$ prompt, type: calterm 124 andpress <ENTER>.b. Set up the Function Generator for a 0.4 Hzsquare wave

Página 57

1-4 IDENTIFICATIONNUMBERAll ANRITSU instruments are assigned a unique six-digit ID number,such as “403002.” The ID number is imprinted on a decal that

Página 58

m.Now, adjust the center frequency control to po-sition the high carrier at the center of the dis-play. Note the frequency reading.n. The difference b

Página 59

f.When finished setting the DAC, pressQ on thekeyboard to go to the next calibration step.When the DAC has been completely adjusted,the program will e

Página 60

quency control to position the high (or low) car-rier at the center of the display. Note thefrequency reading.j.On the keyboard, enter1 to toggle the

Página 61 - Performance Verification

w.When finished setting the DAC, pressQ on thekeyboard to return to the menu. Then, enter3to go to the next calibration step (adjusting theDAC to obta

Página 62

Models 682XXB with Firmware Version 2.18 and aboveModels 683XXB with Firmwave Version 2.20 and aboveModels 682X5B/683X5B with Firmware Version 1.07 an

Página 63

4. Connect the 682XXB/683XXB RF OUTPUT to theSpectrum Analyzer RF Input.NOTEBefore beginning this calibration proce-dure, always let the 682XXB/683XXB

Página 64 - VERIFICATION TEST EQUIPMENT

3. External Unlocked Wide FM Mode Sensitivitycalibration is accomplished by adjusting the FMVariable Gain Control DAC to obtain a 200 MHzFM deviation

Página 65

4. Internal Unlocked Wide FM Mode Sensitivitycalibration is accomplished by adjusting the FMVariable Gain Control DAC to obtain a 200 MHzFM deviation

Página 66 - 3-5 682XXB/683XXB POWER

k. Now adjust the center frequency control to po-sition the low (or high) carrier at the center ofthe display. Note the frequency reading.l. The diffe

Página 67 - VERIFICATION POWER LEVELS

When the DAC has been completely adjusted,the program will exit to the$ prompt.g. Record step completion on the Test Record.6. Internal Locked, Locked

Página 68 - 3-6 INTERNAL TIME BASE

When ordering parts or corresponding with ANRITSU Customer Serv-ice, please use the correct serial number with reference to the specificinstrument’s m

Página 69 - VERIFICATION AGING RATE TEST

c. Set up the Function Generator for a 99.8 kHzsine wave with an output level of 0.707 voltsRMS (2 volts peak to peak). Use a frequencycounter to veri

Página 70

4-14 PHASE MODULATION(FM) CALIBRATIONThis procedure provides the steps necessary to perform phase modula-tion (FM) calibration for 682XXB/683XXBs with

Página 71 - 3-7 FREQUENCY

4. Connect the 682XXB/683XXB RF OUTPUT to theSpectrum Analyzer RF Input.NOTEBefore beginning this calibration proce-dure, always let the 682XXB/683XXB

Página 72 - VERIFICATION SYNTHESIS TESTS

When the DAC has been completely adjusted,the program will exit to the$ prompt.g. Record step completion on the Test Record.2. Internal Wide FM Mode S

Página 73

c. On the Spectrum Analyzer, set the Span/Div to50 kHz per division.d. On the computer keyboard, use the ‘, 1, 2, and3 keys to increment and the 7, 8,

Página 74 - 3-8 SPURIOUS SIGNALS

When the DAC has been completely adjusted,the program will exit to the$ prompt.g. Record step completion on the Test Record.5. Internal Narrow FM Mode

Página 75 - 682XXB/683XXB MM 3-15

c. On the Spectrum Analyzer, set the Span/Div ot50 kHz per division.d. On the computer keyboard, use the ‘, 1, 2, and3 keys to increment and the 7, 8,

Página 76 - 3-16 682XXB/683XXB MM

Table of Contents5-1 INTRODUCTION...5-35-2 RECOMMENDED TEST EQUIPMENT...5-35-3 ERROR AND WARNING/STATUS MESSAGES. . . 5-3Self-Test

Página 77 - 682XXB/683XXB MM 3-17

The majority of the troubleshooting procedures presented in this chapter requirethe removal of the instrument covers to gain access to test points on

Página 78 - 3-9 HARMONIC TEST: RF

Chapter 5Troubleshooting5-1 INTRODUCTION This chapter provides information for troubleshooting signal generatormalfunctions. The troubleshooting proce

Página 79 - 682XXB/683XXB MM 3-19

1-7 OPTIONS The following instrument options are available.Option 1, Rack Mounting. Rack mount kit containing a set oftrack slides (90° tilt capabilit

Página 80 - 3-20 682XXB/683XXB MM

5-4 682XXB/683XXB MMError MessageTroubleshootingTablePageNumberError 100DVM Ground Offset Failed5-5 5-18Error 101DVM Positive 10V Reference5-5 5-18Err

Página 81 - 682XXB/683XXB MM 3-21

682XXB/683XXB MM 5-5Error MessageTroubleshootingTablePageNumberError 120Delta-F Circuits Failed5-16 5-36Error 121Unleveled Indicator Failed5-17 5-37Er

Página 82 - 3-10 SINGLE SIDEBAND

5-6 682XXB/683XXB MMSELF-TESTTROUBLESHOOTING ERROR MESSAGESError MessageTroubleshootingTablePageNumberError 144RF was Off when Selfteststarted. Some t

Página 83 - VERIFICATION PHASE NOISE TEST

NormalOperationError andWarning/StatusMessagesWhen an abnormal condition is detected during op-eration, the 682XXB/683XXB displays an error mes-sage t

Página 84

5-8 682XXB/683XXB MMError Message DescriptionERRContinued:(2) The external FM modulating signal exceeds the inputvoltage range. In addition, the messa

Página 85

682XXB/683XXB MM 5-9ERROR AND WARNING/TROUBLESHOOTING STATUS MESSAGESWarning/StatusMessageDescriptionOVN COLDThis warning message indicates that the 1

Página 86 - 3-11 POWER LEVEL

5-4 MALFUNCTIONS NOTDISPLAYING AN ERRORMESSAGEThe 682XXB/683XXB must be operating to run self-test. Therefore,malfunctions that cause the instrument t

Página 87 - 682XXB/683XXB MM 3-27

682XXB/683XXB MM 5-11J1J2 J3J4 J5 J6J7J1J2 J3J4 J5 J6J7J1J2 J3J4 J5 J6J7J1J2 J3J4 J5 J6J7TestPointsRear PanelA15Regulator PCBA3A4A5A6A7A9A8A10A11A12A1

Página 88 - 3-28 682XXB/683XXB MM

5-12 682XXB/683XXB MMTROUBLESHOOTINGTROUBLESHOOTING TABLESSignal Generator Will Not Turn On(OPERATE light is OFF)Normal Operation: When the 682XXB/683

Página 89 - 682XXB/683XXB MM 3-29

682XXB/683XXB MM 5-13TROUBLESHOOTINGTROUBLESHOOTING TABLESIf the voltage is correct, the Front Panel assembly or thecable between Motherboard connecto

Página 90 - 3-12 AMPLITUDE

Option 17A, No Front Panel. Deletes the front panel for use inremote control applications where a front panel display or key-board control are not nee

Página 91 - VERIFICATION MODULATION TEST

5-14 682XXB/683XXB MMTROUBLESHOOTINGTROUBLESHOOTING TABLESNo Pulse Modulation of the RF OutputDescription: The signal generator does not display any e

Página 92

682XXB/683XXB MM 5-15TROUBLESHOOTINGTROUBLESHOOTING TABLESIf the signals are present and correct, go to step 8.If the signals are not present or are i

Página 93 - 3-13 FREQUENCY

5-16 682XXB/683XXB MMOutput Power Related Problems(>40 GHz)682XXB/683XXB Models with SQMDescription: The signal generator does not display any erro

Página 94

682XXB/683XXB MM 5-17TROUBLESHOOTINGTROUBLESHOOTING TABLESStep 4. Connect a 562 Scalar Network Analyzer to the 682XXB/683XXB as follows:a. Connect the

Página 95

5-18 682XXB/683XXB MMInternal DVM TestsError 100 DVM Ground Offset Failed, orError 101 DVM Positive 10V Reference, orError 102 DVM Negative 10V Refere

Página 96

682XXB/683XXB MM 5-19TROUBLESHOOTINGTROUBLESHOOTING TABLESPower Supply TestsWARNINGVoltages hazardous to life are present throughout the powersupply c

Página 97

5-20 682XXB/683XXB MMTROUBLESHOOTINGTROUBLESHOOTING TABLESStep 2. Perform the following procedure to isolate malfunctionswhen the voltages from severa

Página 98

682XXB/683XXB MM 5-21±15VG Supply ProblemsThis supply provides ±15 volts to the YIG Driver; SDM, SQM Driver;CPU; and CPU I/O circuits andw the Switche

Página 99 - 3-14 PULSE MODULATION

5-22 682XXB/683XXB MM±15VA Supply ProblemsThis supply provides ±15 volts to the Function Generator, PIN Control,ALC, FM, and Analog Instruction circui

Página 100 - 3-40 682XXB/683XXB MM

682XXB/683XXB MM 5-23±15VLP Supply ProblemsThis supply provides ±15 volts to the Pulse Generator and the Refer-ence, Coarse, Fine, and YIG Loop circui

Página 101

1-9 PREVENTIVEMAINTENANCEThe 682XXB/683XXB must always receive adequate ventilation. Ablocked fan filter can cause the instrument to overheat and shut

Página 102 - 3-42 682XXB/683XXB MM

5-24 682XXB/683XXB MM±15VFM Supply ProblemsThis supply provides ±15 volts to the FM circuits.Step 7. Perform the following procedure to isolate malfun

Página 103 - 3-15 PULSE MODULATION

682XXB/683XXB MM 5-25–18VT Supply ProblemsThis supply provides –18 volts to the front panel LCD contrast circuitand to drive the YIG-tuned oscillator

Página 104 - 3-44 682XXB/683XXB MM

5-26 682XXB/683XXB MM–43VT Supply ProblemsThis supply provides –43 volts to drive the YIG-tuned oscillator maintuning coil during bandswitching, fast

Página 105 - 3-16 PULSE MODULATION

682XXB/683XXB MM 5-27+24VH Supply ProblemsThis supply provides +24 volts for the YIG-tuned oscillator heater, theV/GHz circuit on the A12 PCB, and the

Página 106 - VERIFICATION RF ON/OFF RATIO

5-28 682XXB/683XXB MMPower Supply Not Phase-LockedError 106 Power Supply not LockedDescription: The switching power supply is not phase locked to the4

Página 107

682XXB/683XXB MM 5-29A3 Reference LoopError 108 Crystal Oven ColdDescription: The oven of the 100 MHz crystal oscillator or the Option16 high-stabilit

Página 108 - 3-17 PHASE MODULATION

5-30 682XXB/683XXB MMError 110 The 100MHz Reference is not Locked to the HighStability 10MHz Crystal OscillatorDescription: The reference loop is not

Página 109 - VERIFICATION MODULATION TESTS

682XXB/683XXB MM 5-31Step 6. Using the spectrum analyzer, verify the presence of the+3 dBm ±5 dB, 10 MHz signal at the end of the cable.If present, re

Página 110

5-32 682XXB/683XXB MMA4 Coarse LoopError 112 Coarse Loop Osc FailedDescription: The coarse loop oscillator is not phase-locked.Step 1. Disconnect cabl

Página 111 - Calibration

682XXB/683XXB MM 5-33A7 YIG LoopError 113 YIG Loop Osc FailedError 115 Not Locked Indicator FailedDescription: Error 113 indicates that the YIG loop i

Página 112

WARRANTYThe ANRITSU product(s) listed on the title page is (are) warranted against defects in materials andworkmanship for one year from the date of s

Página 113

1-10 682XXB/683XXB MMGENERAL STATIC-SENSITIVE COMPONENTINFORMATION HANDLING PRECAUTIONS1. Do not touch exposed contactson any static sensitivecomponen

Página 114 - 4-5 CONNECTOR AND KEY

5-34 682XXB/683XXB MMStep 8. Run self-test.If error 113 or 115 is not displayed, the problem is cleared.If either error 113 or 115 is displayed, conta

Página 115 - CALIBRATION TEST EQUIPMENT

682XXB/683XXB MM 5-35A11 FM PCBError 116 FM Loop Gain Check FailedDescription: The FM loop has failed or the loop gain is out of toler-ance.Step 1. Pe

Página 116 - CALIBRATION FOLLOWING

5-36 682XXB/683XXB MMTROUBLESHOOTINGTROUBLESHOOTING TABLESA12 Analog InstructionError 107 Sweep Time Check FailedError 117 Linearizer Check FailedErro

Página 117 - CALIBRATION INITIAL SETUP

682XXB/683XXB MM 5-37A10 ALCError 121 Unleveled Indicator FailedError 122 Level Reference FailedError 123 Detector Log Amp FailedError 127 Detector In

Página 118

5-38 682XXB/683XXB MMIf present, replace the A10 PCB.If not present, replace the cable W122.Error 143 Slope DAC FailedDescription: Error 143 indicates

Página 119

682XXB/683XXB MM 5-39YIG-tuned OscillatorError 124 Full Band Unlocked and UnleveledError 125 8.4-20 GHz Unlocked and UnleveledError 126 2-8.4 GHz Unlo

Página 120

5-40 682XXB/683XXB MMIf the RF signal is correct in both frequency and ampli-tude throughout the full sweep, go to step 8.If there is no RF signal for

Página 121

682XXB/683XXB MM 5-41Output Power Level Related Problems(0.01 to 20 GHz)Error 128 .01-2 GHz UnleveledDescription: Error 128 indicates a failure of of

Página 122

5-42 682XXB/683XXB MMUnleveled with no/low output power:Step 1. Set up the 682XXB/683XXB as follows:a.682XXB Setup:CW/SWEEP SELECT: StepF1: 0.010 GHzF

Página 123 - 4-7 PRELIMINARY

682XXB/683XXB MM 5-43Step 7. Connect a 562 Scalar Network Analyzer to the 682XXB/683XXB as follows:a. Connect the 682XXB/683XXB AUX I/O to the 562 AUX

Página 124 - CALIBRATION CALIBRATION

1-11 STARTUPCONFIGURATIONSThe 682XXB/683XXB comes from the factory with a jumper acrosspins 2 and 3 of front panel connector J12 (Figure 1-4). In this

Página 125

5-44 682XXB/683XXB MMError 129 Switched Filter or Level Detector FailedDescription: Error 129 indicates a failure of either the switched filteror leve

Página 126

682XXB/683XXB MM 5-45Unleveled with no/low output power:Step 1. Set up the 682XXB/683XXB as follows:a.682XXB Setup:CW/SWEEP SELECT: StepF1: 0.010 GHzF

Página 127 - 4-8 SWITCHED FILTER

5-46 682XXB/683XXB MMStep 5. Set up the 562 Scalar Network Analyzer as follows:a. Press SYSTEM MENU key.b. From System Menu display, select RESET.c. P

Página 128 - SWITCHED FILTER

682XXB/683XXB MM 5-47TROUBLESHOOTINGTROUBLESHOOTING TABLESError 130 2-3.3 GH Switched FilterError 131 3.3-5.5 GH Switched FilterError 132 5.5-8.4 GH S

Página 129

5-48 682XXB/683XXB MMTROUBLESHOOTINGTROUBLESHOOTING TABLESError 135 Modulator or Driver FailedDescription: Error 135 indicates a failure of the modula

Página 130

682XXB/683XXB MM 5-49Output Power Level Related Problems(20 to 40 GHz)682XXB/683XXB Models with SDMError 138 SDM Unit or Driver FailedDescription: Err

Página 131

5-50 682XXB/683XXB MMError 139 32-40 GHz SDM Section FailedError 140 25-32 GHz SDM Section FailedError 141 20-25 GHz SDM Section FailedDescription: Ea

Página 132 - RF LEVEL

682XXB/683XXB MM 5-51Error 144 RF was Off when Selftest started. Some tests wherenot performedDescription: Indicates that some self-tests where not pe

Página 133 - 4-10 ALC SLOPE

5-52 682XXB/683XXB MMTROUBLESHOOTINGTROUBLESHOOTING TABLESError 147 Internal FM circuitry failedDescription: Indicates a failure of the internal frequ

Página 134 - ALC SLOPE

682XXB/683XXB MM 5-53/5-54TROUBLESHOOTINGTROUBLESHOOTING TABLESStep 5. Reconnect cable W108 to A5J4 and disconnect cable W121 atA5J5.Step 6. Using the

Página 135

1-12 RECOMMENDED TESTEQUIPMENTTable 1-2 provides a list of recommended test equipment needed forthe performance verification, calibration, and trouble

Página 137

Table of Contents6-1 INTRODUCTION...6-36-2 REMOVING AND REPLACING THE CHASSISCOVERS ...6-4Preliminary ...

Página 138

6-8 REMOVING AND REPLACING THE A16 ORA17 PCB...6-11Preliminary...6-11Procedure...6-116-9 REMOVING

Página 139

Chapter 6Removal and ReplacementProcedures6-1 INTRODUCTION This chapter provides procedures for gaining access to the major682XXB/683XXB assemblies, s

Página 140

6-2 REMOVING ANDREPLACING THECHASSIS COVERSTroubleshooting procedures require removal of the top cover. Replace-ment of some 682XXB/683XXB assemblies

Página 141 - ALC BANDWIDTH

Step 12 Remove the screw that fastens the otherside cover to the chassis. (The screw is lo-cated at the rear of the instrument.)Step 13 Remove the sid

Página 142

6-3 REMOVING ANDREPLACING THE FRONTPANEL ASSEMBLYThis paragraph provides instructions for removing and replacing thefront panel assembly of the 682XXB

Página 143

682XXB/683XXB MM 6-7REMOVAL AND FRONT PANEL ASSEMBLYREPLACEMENT PROCEDURES REMOVAL DIAGRAMFigure 6-2. Front Panel Assembly Removal

Página 144

6-4 REMOVING ANDREPLACING THE A3, A4,A5, OR A6 PCBThis paragraph provides instructions for removing and replacing theA3 Reference Loop PCB, the A4 Coa

Página 145

682XXB/683XXB MM 6-9REMOVAL AND PCB AND COMPONENTREPLACEMENT PROCEDURES LOCATOR DIAGRAMJ1J2 J3J4 J5 J6J7J1J2 J3J4 J5 J6J7J1J2 J3J4 J5 J6J7J1J2 J3J4 J5

Página 146

682XXB/683XXB MM 1-13INSTRUMENTCRITICALSPECIFICATIONRECOMMENDEDMANUFACTURER/MODEL USAGE(1)Modulation Analyzer Frequency Input: 10 MHz(or the IF of the

Página 147

6-5 REMOVING ANDREPLACING THE A7 PCBThis paragraph provides instructions for removing and replacing theA7 YIG Loop PCB, which is located in the main c

Página 148

6-7 REMOVING ANDREPLACING THE A13,A14, OR A15 PCBThis paragraph provides instructions for removing and replacing theA13 YIG Driver PCB, the A14 SDM, S

Página 149

6-9 REMOVING ANDREPLACING THE A18 ORA19 PCBThis paragraph provides instructions for removing and replacing theA18 Power Supply PCB or the A19 AC Line

Página 150

6-10 REMOVING ANDREPLACING THE REARPANEL ASSEMBLYThis paragraph provides instructions for removing and replacing therear panel assembly of the 682XXB/

Página 151

Step 9 Disconnect the cable assembly from theA21 Line Filter/Rectifier PCB at connec-tor P2 on the A19 PCB.Step 10 Carefully pull the rear panel assem

Página 152

682XXB/683XXB MM 6-15REMOVAL AND REAR PANEL ASSEMBLYREPLACEMENT PROCEDURES REMOVAL DIAGRAMFigure 6-4. Rear Panel Assembly Removal

Página 153

6-11 REMOVING ANDREPLACING THEA21 PCBThis paragraph provides instructions for removing and replacing theA21 Line Filter/Rectifier PCB, which is locate

Página 154

6-12 REMOVING ANDREPLACING THEA21-1 PCBThis paragraph provides instructions for removing and replacing theA21-1 BNC/AUX I/O Connector PCB, which is lo

Página 155

6-13 REMOVING ANDREPLACING THE FANASSEMBLYThis paragraph provides instructions for removing and replacing thefan assembly, which is located on the rea

Página 156

Appendix ATest RecordsA-1 INTRODUCTION This appendix provides test records for recording the results of thePerformance Verification tests (Chapter 3)

Página 157

1-13 EXCHANGEASSEMBLY PROGRAMANRITSU maintains an exchange assembly program for selected682XXB/683XXB subassemblies and RF components. If a malfunctio

Página 159

ANRITSU Model 68237B/68337B Date: __________________________Serial Number __________________ Tested By: __________________________682XXB/683XXB MM A-3

Página 160

A-4 682XXB/683XXB MM3-7 Frequency Synthesis TestsCoarse Loop/YIG Loop Test Procedure Fine Loop Test Procedure (Standard 68X37B)Test Frequency (in GHz)

Página 161 - CALIBRATION (FM) CALIBRATION

682XXB/683XXB MM A-53-8 Spurious Signals Test: RF Output Signals <2 GHzThis test is not applicable to the 68237B/68337B model.3-9 Harmonic Test: RF

Página 162

A-6 682XXB/683XXB MMTEST MODELRECORD 68237B/68337B3-9 Harmonic Test: RF Output Signals From 2 to 20 GHz (Continued)Test Procedure (11 to 20 GHz)Measur

Página 163

682XXB/683XXB MM A-7TEST MODELRECORD 68237B/68337B3-10 Single Sideband Phase Noise TestTest ProcedureMeasured Value Upper LimitSet F1 to 2.0 GHzRecord

Página 164

A-8 682XXB/683XXB MM3-11 Power Level Accuracy and Flatness Tests(Model 68237B/68337B without Option 2A Step Attenuator)Power Level Accuracy Test Proce

Página 165

682XXB/683XXB MM A-93-11 Power Level Accuracy and Flatness Tests (Continued)(Model 68237B/68337B with Option 2A Step Attenuator)Power Level Accuracy T

Página 166

A-10 682XXB/683XXB MM3-11 Power Level Accuracy and Flatness Tests (Continued)(Model 68237B/68337B with Option 15B High Power & without Option 2A S

Página 167 - Troubleshooting

682XXB/683XXB MM A-113-11 Power Level Accuracy And Flatness Tests (Continued)(Model 68237B/68337B with Option 15B High Power & Option 2A Step Atte

Página 168

682XXB/683XXB MM 1-15SUBASSEMBLY OR PART NAME ANRITSU PART NUMBERPrinted Circuit Board AssembliesFront Panel Assy 683XXB ND40832Front Panel Assy 682XX

Página 169

A-12 682XXB/683XXB MMTEST MODELRECORD 68237B/68337B3-12 Amplitude Modulation TestAM Imput Sensitivity ProcedureLower Limit Measured Value Upper LimitS

Página 170 - SELF-TEST

682XXB/683XXB MM A-13TEST MODELRECORD 68237B/68337B3-14 Pulse Modulation Tests: Rise Time, Fall Time, Overshoot, and LevelRise Time, Fall Time, and Ov

Página 171

A-14 682XXB/683XXB MMTEST MODELRECORD 68237B/68337B3-15 Pulse Modulation Test: Video FeedthroughTest ProcedureLower Limit Measured Value Upper LimitSe

Página 172

ANRITSU Model 68237B/68337B Date: __________________________Serial Number __________________ Calibrated By: __________________________682XXB/683XXB MM

Página 173 - ERROR AND WARNING/

A-16 682XXB/683XXB MMTEST MODELRECORD 68237B/68337B4-10 ALC Slope Calibration (68337B having Firmware Version 1.01 to 2.00)Procedure StepStep Completi

Página 174

682XXB/683XXB MM A-17TEST MODELRECORD 68237B/68337B4-13 FM Calibration (68237B/68337B with Firmware Version 1.01 to 2.10)Procedure StepStep Completion

Página 175

A-18 682XXB/683XXB MM4-14 Phase Modulation (FM) Calibration (Option 6)Procedure StepStep Completion1. External Wide M Mode Sensitivity Calibration (ca

Página 176 - 5-5 TROUBLESHOOTING

ANRITSU Model 68245B/68345B Date: __________________________Serial Number __________________ Tested By: __________________________682XXB/683XXB MM A-1

Página 177 - CONNECTOR AND

A-20 682XXB/683XXB MMTEST MODELRECORD 68245B/68345B3-7 Frequency Synthesis TestsCoarse Loop/YIG Loop Test Procedure Fine Loop Test Procedure (Standard

Página 178 - TROUBLESHOOTING TABLES

682XXB/683XXB MM A-213-8 Spurious Signals Test: RF Output Signals £2.2 GHzTest ProcedureMeasured Value Upper LimitSet F1 to 500 MHzRecord the level of

Página 179

1-16 682XXB/683XXB MMGENERALINFORMATION PARTS LISTSUBASSEMBLY OR PART NAME ANRITSU PART NUMBERRF ComponentsYIG-Tuned Oscillator, 2 to 20 GHz C27327Dow

Página 180

A-22 682XXB/683XXB MM3-9 Harmonic Test: RF Output Signals From 2.2 to 20 GHzTest Procedure (2.2 to 10 GHz)Measured Value Upper LimitSet F1 to 2.4 GHzR

Página 181

682XXB/683XXB MM A-233-9 Harmonic Test: RF Output Signals From 2.2 to 20 GHz (Continued)Test Procedure (11 to 20 GHz)Measured Value Upper LimitSet F1

Página 182

A-24 682XXB/683XXB MM3-10 Single Sideband Phase Noise TestTest ProcedureMeasured Value Upper LimitSet F1 to 0.6 GHzRecord the phase noise levels at th

Página 183

682XXB/683XXB MM A-253-11 Power Level Accuracy and Flatness Tests(Model 68245B/68345B without Option 2A Step Attenuator)Power Level Accuracy Test Proc

Página 184

A-26 682XXB/683XXB MM3-11 Power Level Accuracy and Flatness Tests (Continued)(Model 68245B/68345B with Option 2A Step Attenuator)Power Level Accuracy

Página 185

682XXB/683XXB MM A-273-11 Power Level Accuracy and Flatness Tests (Continued)(Model 68245B/68345B with Option 15B High Power & without Option 2A S

Página 186

A-28 682XXB/683XXB MM3-11 Power Level Accuracy and Flatness Tests (Continued)(Model 68245B/68345B with Option 15B High Power & Option 2A Step Atte

Página 187

682XXB/683XXB MM A-293-12 Amplitude Modulation TestAM Imput Sensitivity ProcedureLower Limit Measured Value Upper LimitSet F1 to 5.0 GHzMeasure and re

Página 188

A-30 682XXB/683XXB MM3-14 Pulse Modulation Tests: Rise Time, Fall Time, Overshoot, and LevelRise Time, Fall Time, and OvershootLower Limit Measured Va

Página 189

682XXB/683XXB MM A-313-14 Pulse Modulation Tests: Rise Time, Fall Time, Overshoot, and Level (Continued)Pulse Level Accuracy (5 GHz, Pulse Width = 0.5

Página 190

682XXB/683XXB MM 1-17GENERALINFORMATION PARTS LISTSUBASSEMBLY OR PART NAME ANRITSU PART NUMBERFan Assembly A40513Fan Mount 790-425Fan Membrane (Honey

Página 191

A-32 682XXB/683XXB MM3-16 Pulse Modulation Test: RF On/Off RatioTest Procedure (1 GHz)Lower Limit Measured Value Upper LimitSet F1 to 1.10 GHzMeasure

Página 192

ANRITSU Model 68245B/68345B Date: __________________________Serial Number __________________ Calibrated By: __________________________682XXB/683XXB MM

Página 193

A-34 682XXB/683XXB MM4-10 ALC Slope Calibration (68345B having Firmware Version 1.00 and above)Procedure StepStep Completion5. ALC Slope DAC adjustmen

Página 194

682XXB/683XXB MM A-354-13 FM Calibration (68245B/68345B with Firmware Version 1.00)Procedure StepStep Completion1. FM Meter Calibration (calterm 123).

Página 195

A-36 682XXB/683XXB MMTEST MODELRECORD 68245B/68345B4-14 Phase Modulation (FM) Calibration (Option 6)Procedure StepStep Completion1. External Wide M Mo

Página 196

ANRITSU Model 68247B/68347B Date: __________________________Serial Number __________________ Tested By: __________________________682XXB/683XXB MM A-3

Página 197

A-38 682XXB/683XXB MMTEST MODELRECORD 68247B/68347B3-7 Frequency Synthesis TestsCoarse Loop/YIG Loop Test Procedure Fine Loop Test Procedure (Standard

Página 198

682XXB/683XXB MM A-393-8 Spurious Signals Test: RF Output Signals <2 GHzTest ProcedureMeasured Value Upper LimitSet F1 to 10 MHzRecord the presence

Página 199

A-40 682XXB/683XXB MMTEST MODELRECORD 68247B/68347B3-9 Harmonic Test: RF Output Signals From 2 to 20 GHzTest Procedure (2 to 10 GHz)Measured Value Upp

Página 200

682XXB/683XXB MM A-41TEST MODELRECORD 68247B/68347B3-9 Harmonic Test: RF Output Signals From 2 to 20 GHz (Continued)Test Procedure (11 to 20 GHz)Measu

Página 201

1-18 682XXB/683XXB MMUNITED STATESANRITSU COMPANY490 Jarvis DriveMorgan Hill, CA 95037-2809Telephone: (408) 776-83001-800-ANRITSUFAX: 408-776-1744FRAN

Página 202

A-42 682XXB/683XXB MMTEST MODELRECORD 68247B/68347B3-10 Single Sideband Phase Noise TestTest ProcedureMeasured Value Upper LimitSet F1 to 0.6 GHzRecor

Página 203

682XXB/683XXB MM A-433-11 Power Level Accuracy and Flatness Tests(Model 68247B/68347B without Option 2A Step Attenuator)Power Level Accuracy Test Proc

Página 204

A-44 682XXB/683XXB MM3-11 Power Level Accuracy and Flatness Tests (Continued)(Model 68247B/68347B with Option 2A Step Attenuator)Power Level Accuracy

Página 205

682XXB/683XXB MM A-453-11 Power Level Accuracy and Flatness Tests (Continued)(Model 68247B/68347B with Option 15B High Power & without Option 2A S

Página 206

A-46 682XXB/683XXB MM3-11 Power Level Accuracy and Flatness Tests (Continued)(Model 68247B/68347B with Option 15B High Power & Option 2A Step Atte

Página 207

682XXB/683XXB MM A-473-12 Amplitude Modulation TestAM Imput Sensitivity ProcedureLower Limit Measured Value Upper LimitSet F1 to 5.0 GHzMeasure and re

Página 208

A-48 682XXB/683XXB MMTEST MODELRECORD 68247B/68347B3-14 Pulse Modulation Tests: Rise Time, Fall Time, Overshoot, and LevelRise Time, Fall Time, and Ov

Página 209

682XXB/683XXB MM A-49TEST MODELRECORD 68247B/68347B3-14 Pulse Modulation Tests: Rise Time, Fall Time, Overshoot, and Level (Continued)Pulse Level Accu

Página 210

A-50 682XXB/683XXB MMTEST MODELRECORD 68247B/68347B3-16 Pulse Modulation Test: RF On/Off RatioTest Procedure (1 GHz)Lower LimitMeasuredValueUpper Limi

Página 211

ANRITSU Model 68247B/68347B Date: __________________________Serial Number __________________ Calibrated By: __________________________682XXB/683XXB MM

Página 212

Table of Contents2-1 INTRODUCTION...2-32-2 682XXB/683XXB MAJOR SUBSYSTEMS...2-3Digital Control...2-3Front Panel ...

Página 213

A-52 682XXB/683XXB MMTEST MODELRECORD 68247B/68347B4-10 ALC Slope Calibration (68347B having Firmware Version 1.01 to 2.00)Procedure StepStep Completi

Página 214

682XXB/683XXB MM A-53TEST MODELRECORD 68247B/68347B4-13 FM Calibration (68247B/68347B with Firmware Version 1.01 to 2.10)Procedure StepStep Completion

Página 215

A-54 682XXB/683XXB MMTEST MODELRECORD 68247B/68347B4-14 Phase Modulation (FM) Calibration (Option 6)Procedure StepStep Completion1. External Wide M Mo

Página 216

ANRITSU Model 68253B/68353B Date: __________________________Serial Number __________________ Tested By: __________________________682XXB/683XXB MM A-5

Página 217

A-56 682XXB/683XXB MM3-7 Frequency Synthesis TestsCoarse Loop/YIG Loop Test ProcedureTest Frequency (in GHz) Measured Value * Test Frequency (in GHz)

Página 218

682XXB/683XXB MM A-57TEST MODELRECORD 68253B/68353B3-7 Frequency Synthesis TestsFine Loop Test Procedure (Standard 68X53B) Fine Loop Test Procedure (6

Página 219

A-58 682XXB/683XXB MMTEST MODELRECORD 68253B/68353B3-9 Harmonic Test: RF Output Signals From 2 to 20 GHzTest Procedure (2 to 10 GHz)Measured Value Upp

Página 220

682XXB/683XXB MM A-59TEST MODELRECORD 68253B/68353B3-9 Harmonic Test: RF Output Signals From 2 to 20 GHz (Continued)Test Procedure (11 to 20 GHz)Measu

Página 221 - Procedures

A-60 682XXB/683XXB MMTEST MODELRECORD 68253B/68353B3-10 Single Sideband Phase Noise TestTest ProcedureMeasured Value Upper LimitSet F1 to 2.0 GHzRecor

Página 222

682XXB/683XXB MM A-61TEST MODELRECORD 68253B/68353B3-11 Power Level Accuracy and Flatness Tests(Model 68253B/68353B without Option 2A Step Attenuator)

Página 224 - 6-2 REMOVING AND

0.01 to 2 GHz Down Converter...2-240.5 to 2.2 GHz Digital Down Converter...2-25Switched Doubler Module...2-26Source Quadrupler Module

Página 225 - REPLACEMENT PROCEDURES COVERS

A-62 682XXB/683XXB MMTEST MODELRECORD 68253B/68353B3-11 Power Level Accuracy and Flatness Tests (Continued)(Model 68253B/68353B with Option 2A Step At

Página 226 - 6-3 REMOVING AND

682XXB/683XXB MM A-63TEST MODELRECORD 68253B/68353B3-11 Power Level Accuracy and Flatness Tests (Continued)(Model 68253B/68353B with Option 15B High P

Página 227 - 682XXB/683XXB MM 6-7

A-64 682XXB/683XXB MMTEST MODELRECORD 68253B/68353B3-11 Power Level Accuracy and Flatness Tests (Continued)(Model 68253B/68353B with Option 15B High P

Página 228 - 6-4 REMOVING AND

682XXB/683XXB MM A-65TEST MODELRECORD 68253B/68353B3-12 Amplitude Modulation TestAM Imput Sensitivity ProcedureLower Limit Measured Value Upper LimitS

Página 229 - REMOVAL AND PCB AND COMPONENT

A-66 682XXB/683XXB MMTEST MODELRECORD 68253B/68353B3-14 Pulse Modulation Tests: Rise Time, Fall Time, Overshoot, and LevelRise Time, Fall Time, and Ov

Página 230 - 6-6 REMOVING AND

682XXB/683XXB MM A-67/A-68TEST MODELRECORD 68253B/68353B3-15 Pulse Modulation Test: Video FeedthroughTest ProcedureLower Limit Measured Value Upper Li

Página 232 - 6-9 REMOVING AND

ANRITSU Model 68253B/68353B Date: __________________________Serial Number __________________ Calibrated By: __________________________682XXB/683XXB MM

Página 233 - 6-10 REMOVING AND

A-70 682XXB/683XXB MMTEST MODELRECORD 68253B/68353B4-10 ALC Slope Calibration (68353B having Firmware Version 1.01 to 2.00)Procedure StepStep Completi

Página 234 - REMOVAL AND REAR PANEL

682XXB/683XXB MM A-71TEST MODELRECORD 68253B/68353B4-13 FM Calibration (68253B/68353B with Firmware Version 1.01 to 2.10)Procedure StepStep Completion

Página 235 - 682XXB/683XXB MM 6-15

Chapter 2Functional Description2-1 INTRODUCTION This chapter provides brief functional descriptions of the major sub-systems that are contained in eac

Página 236 - 6-11 REMOVING AND

A-72 682XXB/683XXB MMTEST MODELRECORD 68253B/68353B4-14 Phase Modulation (FM) Calibration (Option 6)Procedure StepStep Completion1. External Wide M Mo

Página 237 - 6-12 REMOVING AND

ANRITSU Model 68255B/68355B Date: __________________________Serial Number __________________ Tested By: __________________________682XXB/683XXB MM A-7

Página 238 - 6-13 REMOVING AND

A-74 682XXB/683XXB MM3-7 Frequency Synthesis TestsCoarse Loop/YIG Loop Test ProcedureTest Frequency (in GHz) Measured Value * Test Frequency (in GHz)

Página 239 - Test Records

682XXB/683XXB MM A-753-7 Frequency Synthesis TestsFine Loop Test Procedure (Standard 68X55B) Fine Loop Test Procedure (68X55B with Option 11)Test Freq

Página 240

A-76 682XXB/683XXB MM3-8 Spurious Signals Test: RF Output Signals £2.2 GHzTest ProcedureMeasured Value Upper LimitSet F1 to 500 MHzRecord the level of

Página 241 - 682XXB/683XXB MM A-3

682XXB/683XXB MM A-773-9 Harmonic Test: RF Output Signals From 2.2 to 20 GHzTest Procedure (2.2 to 10 GHz)Measure Value Upper LimitSet F1 to 2.4 GHzRe

Página 242 - RECORD 68237B/68337B

A-78 682XXB/683XXB MMTest Procedure (11 to 20 GHz)Measure Value Upper LimitSet F1 to 12.4 GHzRecord the level of all harmonics of the 12.4 GHz carrier

Página 243

682XXB/683XXB MM A-793-10 Single Sideband Phase Noise Test (Continued)Test ProcedureMeasured Value Upper LimitSet F1 to 6.0 GHzRecord the phase noise

Página 244

A-80 682XXB/683XXB MM3-11 Power Level Accuracy and Flatness Tests(Model 68255B/68355B without Option 2A Step Attenuator)Power Level Accuracy Test Proc

Página 245

682XXB/683XXB MM A-813-11 Power Level Accuracy and Flatness Tests (Continued)(Model 68255B/68355B with Option 2A Step Attenuator)Power Level Accuracy

Página 246

The CPU is indirectly linked via the A16 CPU Inter-face PCB to the A3 Reference Loop PCB, the A4Coarse Loop PCB, the A5 Fine Loop PCB, and theA6 Pulse

Página 247

A-82 682XXB/683XXB MM3-11 Power Level Accuracy and Flatness Tests (Continued)(Model 68255B/68355B with Option 15B High Power & without Option 2A S

Página 248

682XXB/683XXB MM A-833-11 Power Level Accuracy and Flatness Tests (Continued)(Model 68255B/68355B with Option 15B High Power & Option 2A Step Atte

Página 249

A-84 682XXB/683XXB MM3-12 Amplitude Modulation TestAM Imput Sensitivity ProcedureLower Limit Measured Value Upper LimitSet F1 to 5.0 GHzMeasure and re

Página 250

682XXB/683XXB MM A-853-14 Pulse Modulation Tests: Rise Time, Fall Time, Overshoot, and LevelRise Time, Fall Time, and OvershootLower Limit Measured Va

Página 251

A-86 682XXB/683XXB MM3-14 Pulse Modulation Tests: Rise Time, Fall Time, Overshoot, and Level (Continued)Pulse Level Accuracy (5 GHz, Pulse Width = 0.5

Página 252

682XXB/683XXB MM A-87/A-88TEST MODELRECORD 68255B/68355B3-16 Pulse Modulation Test: RF On/Off RatioTest Procedure (1 GHz)Lower Limit Measured Value Up

Página 254

ANRITSU Model 68255B/68355B Date: __________________________Serial Number __________________ Calibrated By: __________________________682XXB/683XXB MM

Página 255

A-90 682XXB/683XXB MM4-10 ALC Slope Calibration (68355B having Firmware Version 1.00 and above)Procedure StepStep Completion5. ALC Slope DAC adjustmen

Página 256

682XXB/683XXB MM A-914-13 FM Calibration (68255B/68355B with Firmware Version 1.00)Procedure StepStep Completion1. FM Meter Calibration (calterm 123).

Página 257 - 682XXB/683XXB MM A-19

used to fine tune and phase lock the YIG-tunedoscillator. The A11 PCB also contains circuitryfor frequency modulation of the YIG-tuned os-cillator RF

Página 258 - RECORD 68245B/68345B

A-92 682XXB/683XXB MMTEST MODELRECORD 68255B/68355B4-14 Phase Modulation (FM) Calibration (Option 6)Procedure StepStep Completion1.External Wide Μ Μοδ

Página 259

ANRITSU Model 68259B/68359B Date: __________________________Serial Number __________________ Tested By: __________________________682XXB/683XXB MM A-9

Página 260

A-94 682XXB/683XXB MMTEST MODELRECORD 68259B/68359B3-7 Frequency Synthesis TestsCoarse Loop/YIG Loop Test ProcedureTest Frequency (in GHz) Measured Va

Página 261

682XXB/683XXB MM A-95TEST MODELRECORD 68259B/68359B3-7 Frequency Synthesis TestsFine Loop Test Procedure (Standard 68X59B) Fine Loop Test Procedure (6

Página 262

A-96 682XXB/683XXB MM3-8 Spurious Signals Test: RF Output Signals <2 GHzTest ProcedureMeasured Value Upper LimitSet F1 to 10 MHzRecord the presence

Página 263

682XXB/683XXB MM A-973-9 Harmonic Test: RF Output Signals From 2 to 20 GHzTest Procedure (2 to 10 GHz)Measure Value Upper LimitSet F1 to 2.1 GHzRecord

Página 264

A-98 682XXB/683XXB MM3-10 Single Sideband Phase Noise TestTest ProcedureMeasured Value Upper LimitSet F1 to 0.6 GHzRecord the phase noise levels at th

Página 265

682XXB/683XXB MM A-99TEST MODELRECORD 68259B/68359B3-10 Single Sideband Phase Noise Test (Continued)Test ProcedureMeasured Value Upper LimitSet F1 to

Página 266

A-100 682XXB/683XXB MMTEST MODELRECORD 68259B/68359B3-11 Power Level Accuracy and Flatness Tests(Model 68259B/68359B without Option 2A Step Attenuator

Página 267

682XXB/683XXB MM A-101TEST MODELRECORD 68259B/68359B3-11 Power Level Accuracy and Flatness Tests (Continued)(Model 68259B/68359B with Option 2A Step A

Página 268

A21-1BNC / AUXI/0 CONNECTORPCBAM INEXT ALC INDWELL INAM OUTV/GHz OUTFM OUTSEQ SYNC OUTSERIALI/O10 MHz REF INFrom RF Deck(Option 9)From A3Reference Loo

Página 269

A-102 682XXB/683XXB MMTEST MODELRECORD 68259B/68359B3-11 Power Level Accuracy and Flatness Tests (Continued)(Model 68259B/68359B with Option 15B High

Página 270

682XXB/683XXB MM A-103TEST MODELRECORD 68259B/68359B3-11 Power Level Accuracy and Flatness Tests (Continued)(Model 68259B/68359B with Option 15B High

Página 271 - 682XXB/683XXB MM A-33

A-104 682XXB/683XXB MMTEST MODELRECORD 68259B/68359B3-12 Amplitude Modulation TestAM Imput Sensitivity ProcedureLower Limit Measured Value Upper Limit

Página 272

682XXB/683XXB MM A-105TEST MODELRECORD 68259B/68359B3-14 Pulse Modulation Tests: Rise Time, Fall Time, Overshoot, and LevelRise Time, Fall Time, and O

Página 273

A-106 682XXB/683XXB MMTEST MODELRECORD 68259B/68359B3-14 Pulse Modulation Tests: Rise Time, Fall Time, Overshoot, and Level (Continued)Pulse Level Acc

Página 274

682XXB/683XXB MM A-107/A-108TEST MODELRECORD 68259B/68359B3-16 Pulse Modulation Test: RF On/Off RatioTest Procedure (1 GHz)Lower Limit Measured Value

Página 276 - RECORD 68247B/68347B

ANRITSU Model 68259B/68359B Date: __________________________Serial Number __________________ Calibrated By: __________________________682XXB/683XXB MM

Página 277

A-110 682XXB/683XXB MMTEST MODELRECORD 68259B/68359B4-10 ALC Slope Calibration (68359B having Firmware Version 1.01 to 2.00)Procedure StepStep Complet

Página 278

682XXB/683XXB MM A-1114-13 FM Calibration (68259B/68359B with Firmware Version 1.01 to 2.10)Procedure StepStep Completion1. FM Meter Calibration (calt

Página 279

A14SDM, SQMDriverA9 PINControl10 MHzHI-STABXTAL OSC(Option)10 MHz REF OUTReal Panel BNCSerial Data10 MHz REF INRear Panel BNC0.01 - 2 GHzRF Output0.01

Página 280

A-112 682XXB/683XXB MMTEST MODELRECORD 68259B/68359B4-14 Phase Modulation (FM) Calibration (Option 6)Procedure StepStep Completion1. External Wide M M

Página 281

ANRITSU Model 68263B/68363B Date: __________________________Serial Number __________________ Tested By: __________________________682XXB/683XXB MM A-1

Página 282

A-114 682XXB/683XXB MMTEST MODELRECORD 68263B/68363B3-7 Frequency Synthesis TestsCoarse Loop/YIG Loop Test ProcedureTest Frequency (in GHz) Measured V

Página 283

682XXB/683XXB MM A-115TEST MODELRECORD 68263B/68363B3-7 Frequency Synthesis TestsFine Loop Test Procedure (Standard 68X63B) Fine Loop Test Procedure (

Página 284

A-116 682XXB/683XXB MMTEST MODELRECORD 68263B/68363B3-9 Harmonic Test: RF Output Signals From 2 to 20 GHzTest Procedure (2 to 10 GHz)Measured Value Up

Página 285

682XXB/683XXB MM A-117TEST MODELRECORD 68263B/68363B3-9 Harmonic Test: RF Output Signals From 2 to 20 GHz (Continued)Test Procedure (11 to 20 GHz)Meas

Página 286

A-118 682XXB/683XXB MMTEST MODELRECORD 68263B/68363B3-10 Single Sideband Phase Noise TestTest ProcedureMeasured Value Upper LimitSet F1 to 2.0 GHzReco

Página 287

682XXB/683XXB MM A-119TEST MODELRECORD 68263B/68363B3-11 Power Level Accuracy and Flatness Tests(Model 68263B/68363B without Option 2B Step Attenuator

Página 288

A-120 682XXB/683XXB MM3-11 Power Level Accuracy and Flatness Tests (Continued)(Model 68263B/68363B with Option 2B Step Attenuator)Power Level Accuracy

Página 289 - 682XXB/683XXB MM A-51

682XXB/683XXB MM A-121TEST MODELRECORD 68263B/68363B3-11 Power Level Accuracy and Flatness Tests (Continued)(Model 68263B/68363B with Option 15B High

Página 290

ALC/AM/PulseModulationThis circuit subsystem consists of the A6 Pulse Gen-erator PCB, the A9 PIN Control PCB, the A10 ALCPCB, and the A14 SDM, SQM Dri

Página 291

A-122 682XXB/683XXB MMTEST MODELRECORD 68263B/68363B3-11 Power Level Accuracy and Flatness Tests (Continued)(Model 68263B/68363B with Option 15B High

Página 292

682XXB/683XXB MM A-123TEST MODELRECORD 68263B/68363B3-12 Amplitude Modulation TestAM Imput Sensitivity ProcedureLower Limit Measured Value Upper Limit

Página 293 - 682XXB/683XXB MM A-55

A-124 682XXB/683XXB MMTEST MODELRECORD 68263B/68363B3-14 Pulse Modulation Tests: Rise Time, Fall Time, Overshoot, and LevelRise Time, Fall Time, and O

Página 294 - RECORD 68253B/68353B

682XXB/683XXB MM A-125/A-126TEST MODELRECORD 68263B/68363B3-15 Pulse Modulation Test: Video FeedthroughTest ProcedureLower Limit Measured Value Upper

Página 296

ANRITSU Model 68263B/68363B Date: __________________________Serial Number __________________ Calibrated By: __________________________682XXB/683XXB MM

Página 297

A-128 682XXB/683XXB MMTEST MODELRECORD 68263B/68363B4-10 ALC Slope Calibration (68363B having Firmware Version 1.01 to 2.00)Procedure StepStep Complet

Página 298

682XXB/683XXB MM A-129TEST MODELRECORD 68263B/68363B4-13 FM Calibration (68263B/68363B with Firmware Version 1.01 to 2.10)Procedure StepStep Completio

Página 299

A-130 682XXB/683XXB MMTEST MODELRECORD 68263B/68363B4-14 Phase Modulation (FM) Calibration (Option 6)Procedure StepStep Completion1. External Wide M M

Página 300

ANRITSU Model 68265B/68365B Date: __________________________Serial Number __________________ Tested By: __________________________682XXB/683XXB MM A-1

Página 301

inputs are coupled directly via coaxial cables totheir destination PCBs—the FM input to A11 FMPCB and the Pulse/Trigger input to the A6 PulseGenerator

Página 302

A-132 682XXB/683XXB MM3-7 Frequency Synthesis TestsCoarse Loop/YIG Loop Test ProcedureTest Frequency (in GHz) Measured Value * Test Frequency (in GHz)

Página 303

682XXB/683XXB MM A-1333-7 Frequency Synthesis TestsFine Loop Test Procedure (Standard 68X65B) Fine Loop Test Procedure (68X65B with Option 11)Test Fre

Página 304

A-134 682XXB/683XXB MM3-8 Spurious Signals Test: RF Output Signals £2.2 GHzTest ProcedureMeasured Value Upper LimitSet F1 to 500 MHzRecord the level o

Página 305

682XXB/683XXB MM A-1353-9 Harmonic Test: RF Output Signals From 2.2 to 20 GHzTest Procedure (2.2 to 10 GHz)Measure Value Upper LimitSet F1 to 2.4 GHzR

Página 306

A-136 682XXB/683XXB MM3-9 Harmonic Test: RF Output Signals From 2.2 to 20 GHz (Continued)Test Procedure (11 to 20 GHz)Measure Value Upper LimitSet F1

Página 307 - 682XXB/683XXB MM A-69

682XXB/683XXB MM A-1373-10 Single Sideband Phase Noise Test (Continued)Test ProcedureMeasured Value Upper LimitSet F1 to 6.0 GHzRecord the phase noise

Página 308

A-138 682XXB/683XXB MM3-11 Power Level Accuracy and Flatness Tests(Model 68265B/68365B without Option 2B Step Attenuator)Power Level Accuracy Test Pro

Página 309

682XXB/683XXB MM A-1393-11 Power Level Accuracy and Flatness Tests (Continued)(Model 68265B/68365B with Option 2B Step Attenuator)Power Level Accuracy

Página 310

A-140 682XXB/683XXB MM3-11 Power Level Accuracy and Flatness Tests (Continued)(Model 68265B/68365B with Option 15B High Power & without Option 2B

Página 311 - 682XXB/683XXB MM A-73

682XXB/683XXB MM A-1413-11 Power Level Accuracy and Flatness Tests (Continued)(Model 68265B/68365B with Option 15B High Power & Option 2B Step Att

Página 312 - RECORD 68255B/68355B

signal that (depending on polarity) causes the VCOfrequency to increase or decrease to reduce anyphase difference. When the two inputs match, theloop

Página 313

A-142 682XXB/683XXB MM3-12 Amplitude Modulation TestAM Imput Sensitivity ProcedureLower Limit Measured Value Upper LimitSet F1 to 5.0 GHzMeasure and r

Página 314

682XXB/683XXB MM A-1433-14 Pulse Modulation Tests: Rise Time, Fall Time, Overshoot, and LevelRise Time, Fall Time, and OvershootLower Limit Measured V

Página 315

A-144 682XXB/683XXB MM3-14 Pulse Modulation Tests: Rise Time, Fall Time, Overshoot, and Level (Continued)Pulse Level Accuracy (5 GHz, Pulse Width = 0.

Página 316

682XXB/683XXB MM A-145/A-146TEST MODELRECORD 68265B/68365B3-16 Pulse Modulation Test: RF On/Off RatioTest Procedure (1 GHz)Lower Limit Measured Value

Página 318

ANRITSU Model 68265B/68365B Date: __________________________Serial Number __________________ Calibrated By: __________________________682XXB/683XXB MM

Página 319

A-148 682XXB/683XXB MM4-10 ALC Slope Calibration (68365B having Firmware Version 1.00 and above)Procedure StepStep Completion5. ALC Slope DAC adjustme

Página 320

682XXB/683XXB MM A-1494-13 FM Calibration (68265B/68365B with Firmware Version 1.00)Procedure StepStep Completion1. FM Meter Calibration (calterm 123)

Página 321

A-150 682XXB/683XXB MMTEST MODELRECORD 68265B/68365B4-14 Phase Modulation (FM) Calibration (Option 6)Procedure StepStep Completion1. External Wide M M

Página 322

ANRITSU Model 68269B/68369B Date: __________________________Serial Number __________________ Tested By: __________________________682XXB/683XXB MM A-1

Página 323

26.84 MHzVCXODigitalSynthesizerFrequencySynthesizer206 - 391 MHzVCOFineLoopOscilatorPhase/FrequencyDetector100 kHzPhase ErrorPhaseErrorPhase/Frequency

Página 324

A-152 682XXB/683XXB MMTEST MODELRECORD 68269B/68369B3-7 Frequency Synthesis TestsCoarse Loop/YIG Loop Test ProcedureTest Frequency (in GHz) Measured V

Página 325

682XXB/683XXB MM A-153TEST MODELRECORD 68269B/68369B3-7 Frequency Synthesis TestsFine Loop Test Procedure (Standard 68X69B) Fine Loop Test Procedure (

Página 326

A-154 682XXB/683XXB MMTEST MODELRECORD 68269B/68369B3-8 Spurious Signals Test: RF Output Signals <2 GHzTest ProcedureMeasured Value Upper LimitSet

Página 327 - 682XXB/683XXB MM A-89

682XXB/683XXB MM A-155TEST MODELRECORD 68269B/68369B3-9 Harmonic Test: RF Output Signals From 2 to 20 GHzTest Procedure (2 to 10 GHz)Measure Value Upp

Página 328

A-156 682XXB/683XXB MMTEST MODELRECORD 68269B/68369B3-10 Single Sideband Phase Noise TestTest ProcedureMeasured Value Upper LimitSet F1 to 0.6 GHzReco

Página 329

682XXB/683XXB MM A-157TEST MODELRECORD 68269B/68369B3-10 Single Sideband Phase Noise Test (Continued)Test ProcedureMeasured Value Upper LimitSet F1 to

Página 330

A-158 682XXB/683XXB MM3-11 Power Level Accuracy and Flatness Tests(Model 68269B/68369B without Option 2B Step Attenuator)Power Level Accuracy Test Pro

Página 331 - 682XXB/683XXB MM A-93

682XXB/683XXB MM A-1593-11 Power Level Accuracy and Flatness Tests (Continued)(Model 68269B/68369B with Option 2B Step Attenuator)Power Level Accuracy

Página 332 - RECORD 68259B/68359B

A-160 682XXB/683XXB MMTEST MODELRECORD 68269B/68369B3-11 Power Level Accuracy and Flatness Tests (Continued)(Model 68269B/68369B with Option 15B High

Página 333

682XXB/683XXB MM A-161TEST MODELRECORD 68269B/68369B3-11 Power Level Accuracy and Flatness Tests (Continued)(Model 68269B/68369B with Option 15B High

Página 335

output signal sample with the adjacent coarse-loopharmonic produces a low frequency difference signalthat is the YIG IF signal (21.5 to 40 MHz).The 68

Página 336

A-162 682XXB/683XXB MMTEST MODELRECORD 68269B/68369B3-12 Amplitude Modulation TestAM Imput Sensitivity ProcedureLower Limit Measured Value Upper Limit

Página 337

682XXB/683XXB MM A-163TEST MODELRECORD 68269B/68369B3-14 Pulse Modulation Tests: Rise Time, Fall Time, Overshoot, and LevelRise Time, Fall Time, and O

Página 338

A-164 682XXB/683XXB MMTEST MODELRECORD 68269B/68369B3-15 Pulse Modulation Test: Video FeedthroughTest ProcedureLower Limit Measured Value Upper LimitS

Página 339

682XXB/683XXB MM A-165/A-166TEST MODELRECORD 68269B/68369B3-16 Pulse Modulation Test: RF On/Off RatioTest Procedure (1 GHz)Lower Limit Measured Value

Página 341

ANRITSU Model 68269B/68369B Date: __________________________Serial Number __________________ Calibrated By: __________________________682XXB/683XXB MM

Página 342

A-168 682XXB/683XXB MMTEST MODELRECORD 68269B/68369B4-10 ALC Slope Calibration (68369B having Firmware Version 1.01 to 2.00)Procedure StepStep Complet

Página 343

682XXB/683XXB MM A-169TEST MODELRECORD 68269B/68369B4-13 FM Calibration (68269B/68369B with Firmware Version 1.01 to 2.10)Procedure StepStep Completio

Página 344

A-170 682XXB/683XXB MMTEST MODELRECORD 68269B/68369B4-14 Phase Modulation (FM) Calibration (Option 6)Procedure StepStep Completion1. External Wide M M

Página 345

ANRITSU Model 68275B/68375B Date: __________________________Serial Number __________________ Tested By: __________________________682XXB/683XXB MM A-1

Página 346

requiring even greater stability, the 100 MHz refer-ence oscillator can be phase locked to an optional10 MHz reference (internal or external).RF Outpu

Página 347 - 682XXB/683XXB MM A-109

A-172 682XXB/683XXB MMTEST MODELRECORD 68275B/68375B3-7 Frequency Synthesis TestsCoarse Loop/YIG Loop Test ProcedureTest Frequency (in GHz) Measured V

Página 348

682XXB/683XXB MM A-1733-7 Frequency Synthesis TestsFine Loop Test Procedure (Standard 68X75B) Fine Loop Test Procedure (68X75B with Option 11)Test Fre

Página 349

A-174 682XXB/683XXB MM3-8 Spurious Signals Test: RF Output Signals £2.2 GHzTest ProcedureMeasured Value Upper LimitSet F1 to 500 MHzRecord the level o

Página 350

682XXB/683XXB MM A-1753-9 Harmonic Test: RF Output Signals From 2.2 to 20 GHzTest Procedure (2.2 to 10 GHz)Measure Value Upper LimitSet F1 to 2.4 GHzR

Página 351 - 682XXB/683XXB MM A-113

A-176 682XXB/683XXB MM3-10 Single Sideband Phase Noise TestTest ProcedureMeasured Value Upper LimitSet F1 to 0.6 GHzRecord the phase noise levels at t

Página 352 - RECORD 68263B/68363B

682XXB/683XXB MM A-1773-10 Single Sideband Phase Noise Test (Continued)Test ProcedureMeasured Value Upper LimitSet F1 to 26.5 GHzRecord the phase nois

Página 353

A-178 682XXB/683XXB MM3-11 Power Level Accuracy and Flatness Tests(Model 68275B/68375B without Option 2C Step Attenuator)Power Level Accuracy Test Pro

Página 354

682XXB/683XXB MM A-1793-11 Power Level Accuracy and Flatness Tests (Continued)(Model 68275B/68375B with Option 2C Step Attenuator)Power Level Accuracy

Página 355

A-180 682XXB/683XXB MM3-12 Amplitude Modulation TestAM Imput Sensitivity ProcedureLower Limit Measured Value Upper LimitSet F1 to 5.0 GHzMeasure and r

Página 356

682XXB/683XXB MM A-1813-14 Pulse Modulation Tests: Rise Time, Fall Time, Overshoot, and LevelRise Time, Fall Time, and OvershootLower Limit Measured V

Página 357

FrequencyModulationFrequency modulation (FM) of the YIG-tuned oscil-lator RF output is achieved by summing an externalor internal modulating signal in

Página 358

A-182 682XXB/683XXB MM3-15 Pulse Modulation Test: Video FeedthroughTest ProcedureLower Limit Measured Value Upper LimitSet F1 to 5.0 GHzSet pulse widt

Página 359

682XXB/683XXB MM A-183/A-184TEST MODELRECORD 68275B/68375B3-16 Pulse Modulation Test: RF On/Off RatioTest Procedure (1 GHz)Lower Limit Measured Value

Página 361

ANRITSU Model 68275B/68375B Date: __________________________Serial Number __________________ Calibrated By: __________________________682XXB/683XXB MM

Página 362

A-186 682XXB/683XXB MM4-10 ALC Slope Calibration (68375B having Firware Version 1.00 and above)Procedure StepStep Completion5. ALC Slope DAC adjustmen

Página 363

682XXB/683XXB MM A-1874-13 FM Calibration (68275B/68375B with Firmware Version 1.00)Procedure StepStep Completion1. FM Meter Calibration (calterm 123)

Página 364

A-188 682XXB/683XXB MMTEST MODELRECORD 68275B/68375B4-14 Phase Modulation (FM) Calibration (Option 6)Procedure StepStep Completion1. External Wide M M

Página 365 - 682XXB/683XXB MM A-127

ANRITSU Model 68277B/68377B Date: __________________________Serial Number __________________ Tested By: __________________________682XXB/683XXB MM A-1

Página 366

A-190 682XXB/683XXB MM3-7 Frequency Synthesis TestsCoarse Loop/YIG Loop Test ProcedureTest Frequency (in GHz) Measured Value * Test Frequency (in GHz)

Página 367

682XXB/683XXB MM A-191TEST MODELRECORD 68277B/68377B3-7 Frequency Synthesis TestsFine Loop Test Procedure (Standard 68X77B) Fine Loop Test Procedure (

Página 368

Step SweepModeStep (digital) frequency sweeps of the YIG-tuned os-cillator RF output consist of a series of discrete, syn-thesized steps between a sta

Página 369 - 682XXB/683XXB MM A-131

A-192 682XXB/683XXB MMTEST MODELRECORD 68277B/68377B3-8 Spurious Signals Test: RF Output Signals <2 GHzTest ProcedureMeasured Value Upper LimitSet

Página 370 - RECORD 68265B/68365B

682XXB/683XXB MM A-193TEST MODELRECORD 68277B/68377B3-9 Harmonic Test: RF Output Signals From 2 to 20 GHzTest Procedure (2 to 10 GHz)Measure Value Upp

Página 371

A-194 682XXB/683XXB MMTEST MODELRECORD 68277B/68377B3-10 Single Sideband Phase Noise TestTest ProcedureMeasured Value Upper LimitSet F1 to 0.6 GHzReco

Página 372

682XXB/683XXB MM A-1953-10 Single Sideband Phase Noise Test (Continued)Test ProcedureMeasured Value Upper LimitSet F1 to 26.5 GHzRecord the phase nois

Página 373

A-196 682XXB/683XXB MMTEST MODELRECORD 68277B/68377B3-11 Power Level Accuracy and Flatness Tests(Model 68277B/68377B without Option 2C Step Attenuator

Página 374

682XXB/683XXB MM A-197TEST MODELRECORD 68277B/68377B3-11 Power Level Accuracy and Flatness Tests (Continued)(Model 68277B/68377B with Option 2C Step A

Página 375

A-198 682XXB/683XXB MM3-12 Amplitude Modulation TestAM Imput Sensitivity ProcedureLower Limit Measured Value Upper LimitSet F1 to 5.0 GHzMeasure and r

Página 376

682XXB/683XXB MM A-199TEST MODELRECORD 68277B/68377B3-14 Pulse Modulation Tests: Rise Time, Fall Time, Overshoot, and LevelRise Time, Fall Time, and O

Página 377

A-200 682XXB/683XXB MMTEST MODELRECORD 68277B/68377B3-14 Pulse Modulation Tests: Rise Time, Fall Time, Overshoot, and Level (Continued)Pulse Level Acc

Página 378

682XXB/683XXB MM A-201/A-202TEST MODELRECORD 68277B/68377B3-16 Pulse Modulation Test: RF On/Off RatioTest Procedure (1 GHz)Lower Limit Measured Value

Página 379

NOTEThe instrument uses two internal level de-tection circuits. For frequencies <2 GHz(£2.2GHzfor682X5B/683X5Bmodels),thelevel detector is part of

Página 381

ANRITSU Model 68277B/68377B Date: __________________________Serial Number __________________ Calibrated By: __________________________682XXB/683XXB MM

Página 382

A-204 682XXB/683XXB MMTEST MODELRECORD 68277B/68377B4-10 ALC Slope Calibration (68377B having Firmware Version 1.01 to 2.00)Procedure StepStep Complet

Página 383

682XXB/683XXB MM A-205TEST MODELRECORD 68277B/68377B4-13 FM Calibration (68277B/68377B with Firmware Version 1.01 to 2.10)Procedure StepStep Completio

Página 384

A-206 682XXB/683XXB MMTEST MODELRECORD 68277B/68377B4-14 Phase Modulation (FM) Calibration (Option 6)Procedure StepStep Completion1. External Wide M M

Página 385 - 682XXB/683XXB MM A-147

ANRITSU Model 68285B/68385B Date: __________________________Serial Number __________________ Tested By: __________________________682XXB/683XXB MM A-2

Página 386

A-208 682XXB/683XXB MMTEST MODELRECORD 68285B/68385B3-7 Frequency Synthesis TestsCoarse Loop/YIG Loop Test ProcedureTest Frequency (in GHz) Measured V

Página 387

682XXB/683XXB MM A-2093-7 Frequency Synthesis Tests (Continued)Coarse Loop/YIG Loop Test Procedure (Continued)Test Frequency (in GHz) Measured Value *

Página 388

A-210 682XXB/683XXB MM3-8 Spurious Signals Test: RF Output Signals £2.2 GHzTest ProcedureMeasured Value Upper LimitSet F1 to 500 MHzRecord the level o

Página 389 - 682XXB/683XXB MM A-151

682XXB/683XXB MM A-2113-9 Harmonic Test: RF Output Signals From 2.2 to 20 GHzTest Procedure (2.2 to 10 GHz)Measure Value Upper LimitSet F1 to 2.4 GHzR

Página 390 - RECORD 68269B/68369B

P/O RF DeckDetector 0Sample/HoldDetector 1ALCControlModulator ControlInternal AM(From A8 PCB)D0 - D15L_SEL3A01 - A03FromCPUPulseLevel AmpSerial Data(F

Página 391

A-212 682XXB/683XXB MM3-10 Single Sideband Phase Noise TestTest ProcedureMeasured Value Upper LimitSet F1 to 0.6 GHzRecord the phase noise levels at t

Página 392

682XXB/683XXB MM A-2133-10 Single Sideband Phase Noise Test (Continued)Test ProcedureMeasured Value Upper LimitSet F1 to 26.5 GHzRecord the phase nois

Página 393

A-214 682XXB/683XXB MM3-11 Power Level Accuracy and Flatness Tests(Model 68285B/68385B without Option 2D Step Attenuator)Power Level Accuracy Test Pro

Página 394

682XXB/683XXB MM A-2153-11 Power Level Accuracy and Flatness Tests (Continued)(Model 68285B/68385B with Option 2D Step Attenuator)Power Level Accuracy

Página 395

A-216 682XXB/683XXB MM3-12 Amplitude Modulation TestAM Imput Sensitivity ProcedureLower Limit Measured Value Upper LimitSet F1 to 5.0 GHzMeasure and r

Página 396

682XXB/683XXB MM A-2173-14 Pulse Modulation Tests: Rise Time, Fall Time, Overshoot, and LevelRise Time, Fall Time, and OvershootLower Limit Measured V

Página 397

A-218 682XXB/683XXB MM3-14 Pulse Modulation Tests: Rise Time, Fall Time, Overshoot, and Level (Continued)Pulse Level Accuracy (5 GHz, Pulse Width = 0.

Página 398

682XXB/683XXB MM A-219/A-220TEST MODELRECORD 68285B/68385B3-16 Pulse Modulation Test: RF On/Off RatioTest Procedure (1 GHz)Lower Limit Measured Value

Página 400

ANRITSU Model 68285B/68385B Date: __________________________Serial Number __________________ Calibrated By: __________________________682XXB/683XXB MM

Página 401

Power SweepIn this mode, the CPU has the ALC step the RF out-put through a range of levels specified by the user.This feature can be used in conjuncti

Página 402

A-222 682XXB/683XXB MM4-9 RF Level CalibrationThis calibration is performed using an automatic test system. Contact ANRITSU Customer Service for furth

Página 403

682XXB/683XXB MM A-2234-13 FM Calibration (68285B/68385B with Firmware Version 1.00)Procedure StepStep Completion1. FM Meter Calibration (calterm 123)

Página 404

A-224 682XXB/683XXB MMTEST MODELRECORD 68285B/68385B4-14 Phase Modulation (FM) Calibration (Option 6)Procedure StepStep Completion1. External Wide M M

Página 405 - 682XXB/683XXB MM A-167

ANRITSU Model 68287B/68387B Date: __________________________Serial Number __________________ Tested By: __________________________682XXB/683XXB MM A-2

Página 406

A-226 682XXB/683XXB MMTEST MODELRECORD 68287B/68387B3-7 Frequency Synthesis TestsCoarse Loop/YIG Loop Test ProcedureTest Frequency (in GHz) Measured V

Página 407

682XXB/683XXB MM A-2273-7 Frequency Synthesis Tests (Continued)Coarse Loop/YIG Loop Test Procedure (Continued)Test Frequency (in GHz) Measured Value *

Página 408

A-228 682XXB/683XXB MMTEST MODELRECORD 68287B/68387B3-8 Spurious Signals Test: RF Output Signals <2 GHzTest ProcedureMeasured Value Upper LimitSet

Página 409 - 682XXB/683XXB MM A-171

682XXB/683XXB MM A-229TEST MODELRECORD 68287B/68387B3-9 Harmonic Test: RF Output Signals From 2 to 20 GHzTest Procedure (2 to 10 GHz)Measure Value Upp

Página 410 - RECORD 68275B/68375B

A-230 682XXB/683XXB MMTEST MODELRECORD 68287B/68387B3-10 Single Sideband Phase Noise TestTest ProcedureMeasured Value Upper LimitSet F1 to 0.6 GHzReco

Página 411

682XXB/683XXB MM A-2313-10 Single Sideband Phase Noise Test (Continued)Test ProcedureMeasured Value Upper LimitSet F1 to 26.5 GHzRecord the phase nois

Página 412

struments to the internally generated pulse; thevideo pulse is a TTL level copy of the RF outputpulse; and the sample/hold signal synchronizes theALC

Página 413

A-232 682XXB/683XXB MMTEST MODELRECORD 68287B/68387B3-11 Power Level Accuracy and Flatness Tests(Model 68287B/68387B without Option 2D Step Attenuator

Página 414

682XXB/683XXB MM A-233TEST MODELRECORD 68287B/68387B3-11 Power Level Accuracy and Flatness Tests (Continued)(Model 68287B/68387B with Option 2D Step A

Página 415

A-234 682XXB/683XXB MMTEST MODELRECORD 68287B/68387B3-12 Amplitude Modulation TestAM Imput Sensitivity ProcedureLower Limit Measured Value Upper Limit

Página 416

682XXB/683XXB MM A-235TEST MODELRECORD 68287B/68387B3-14 Pulse Modulation Tests: Rise Time, Fall Time, Overshoot, and LevelRise Time, Fall Time, and O

Página 417

A-236 682XXB/683XXB MMTEST MODELRECORD 68287B/68387B3-14 Pulse Modulation Tests: Rise Time, Fall Time, Overshoot, and Level (Continued)Pulse Level Acc

Página 418

682XXB/683XXB MM A-237/A-238TEST MODELRECORD 68287B/68387B3-16 Pulse Modulation Test: RF On/Off RatioTest Procedure (1 GHz)Lower Limit Measured Value

Página 420

ANRITSU Model 68287B/68387B Date: __________________________Serial Number __________________ Calibrated By: __________________________682XXB/683XXB MM

Página 421

A-240 682XXB/683XXB MMTEST MODELRECORD 68287B/68387B4-10 ALC Slope Calibration (68387B having Firmware Version 2.00 and above)Procedure StepStep Compl

Página 422

682XXB/683XXB MM A-241TEST MODELRECORD 68287B/68387B4-13 FM Calibration (68287B/68387B with Firmware Version 1.01 to 2.10)Procedure StepStep Completio

Página 423 - 682XXB/683XXB MM A-185

RF Deck Con-figurationsAll 682XXB/683XXB RF deck assemblies contain a 2to 20 GHz YIG-tuned oscillator, a switched filter as-sembly, and a directional

Página 424

A-242 682XXB/683XXB MMTEST MODELRECORD 68287B/68387B4-14 Phase Modulation (FM) Calibration (Option 6)Procedure StepStep Completion1. External Wide M M

Página 425

ANRITSU Model 68295B/68395B Date: __________________________Serial Number __________________ Tested By: __________________________682XXB/683XXB MM A-2

Página 426

A-244 682XXB/683XXB MM3-7 Frequency Synthesis TestsCoarse Loop/YIG Loop Test ProcedureTest Frequency (in GHz) Measured Value * Test Frequency (in GHz)

Página 427 - 682XXB/683XXB MM A-189

682XXB/683XXB MM A-2453-7 Frequency Synthesis Tests (Continued)Coarse Loop/YIG Loop Test Procedure (Continued)Test Frequency (in GHz) Measured Value *

Página 428 - RECORD 68277B/68377B

A-246 682XXB/683XXB MM3-8 Spurious Signals Test: RF Output Signals 2.2 GHzTest ProcedureMeasured Value Upper LimitSet F1 to 500 MHzRecord the level o

Página 429

682XXB/683XXB MM A-2473-9 Harmonic Test: RF Output Signals From 2.2 to 20 GHzTest Procedure (2.2 to 10 GHz)Measure Value Upper LimitSet F1 to 2.4 GHzR

Página 430

A-248 682XXB/683XXB MMTEST MODELRECORD 68295B/68395B3-10 Single Sideband Phase Noise TestTest ProcedureMeasured Value Upper LimitSet F1 to 0.6 GHzReco

Página 431

682XXB/683XXB MM A-2493-10 Single Sideband Phase Noise Test (Continued)Test ProcedureMeasured Value Upper LimitSet F1 to 26.5 GHzRecord the phase nois

Página 432

A-250 682XXB/683XXB MM3-11 Power Level Accuracy and Flatness Tests(Model 68295B/68395B)Power Level Accuracy Test ProcedureSet F1 to 5.0 GHz Set F1 to

Página 433

682XXB/683XXB MM A-2513-12 Amplitude Modulation TestAM Imput Sensitivity ProcedureLower Limit Measured Value Upper LimitSet F1 to 5.0 GHzMeasure and r

Página 434

FMMAINBIASModulatorControlSwitchControl>+17 dBm500 MHzDown Converter Assy.D273308.4-20 GHz2-8.4 GHz>+4dBm0.01 - 40 GHz110 dBStepAttenuator(Optio

Página 435

A-252 682XXB/683XXB MM3-14 Pulse Modulation Tests: Rise Time, Fall Time, Overshoot, and LevelRise Time, Fall Time, and OvershootLower Limit Measured V

Página 436

682XXB/683XXB MM A-2533-14 Pulse Modulation Tests: Rise Time, Fall Time, Overshoot, and Level (Continued)Pulse Level Accuracy (5 GHz, Pulse Width = 0.

Página 437

A-254 682XXB/683XXB MMTEST MODELRECORD 68295B/68395B3-16 Pulse Modulation Test: RF On/Off RatioTest Procedure (1 GHz)Lower Limit Measured Value Upper

Página 438

ANRITSU Model 68295B/68395B Date: __________________________Serial Number __________________ Calibrated By: __________________________682XXB/683XXB MM

Página 439

A-256 682XXB/683XXB MM4-9 RF Level CalibrationThis calibration is performed using an automatic test system. Contact ANRITSU Customer Service for furth

Página 440

682XXB/683XXB MM A-2574-13 FM Calibration (68295B/68395B with Firmware Version 1.00)Procedure StepStep Completion1. FM Meter Calibration (calterm 123)

Página 441 - 682XXB/683XXB MM A-203

A-258 682XXB/683XXB MMTEST MODELRECORD 68295B/68395B4-14 Phase Modulation (FM) Calibration (Option 6)Procedure StepStep Completion1. External Wide M M

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ANRITSU Model 68297B/68397B Date: __________________________Serial Number __________________ Tested By: __________________________682XXB/683XXB MM A-2

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A-260 682XXB/683XXB MMTEST MODELRECORD 68297B/68397B3-7 Frequency Synthesis TestsCoarse Loop/YIG Loop Test ProcedureTest Frequency (in GHz) Measured V

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682XXB/683XXB MM A-2613-7 Frequency Synthesis Tests (Continued)Coarse Loop/YIG Loop Test Procedure (Continued)Test Frequency (in GHz) Measured Value *

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Table Of ContentsChapter 1 - General Information1-1 SCOPE OF MANUAL...1-31-2 INTRODUCTION...1-31-3 DESCRIPTION...

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FMMAINBIASModulatorControlSwitchControl>+17 dB m500 M H zDown Converter Assy.D 273308.4-20 G H z2-8.4 G H z>+4dBm3.3 G H z LPF5.5 G H z LPF8.4 G

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A-262 682XXB/683XXB MMTEST MODELRECORD 68297B/68397B3-8 Spurious Signals Test: RF Output Signals <2 GHzTest ProcedureMeasured Value Upper LimitSet

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682XXB/683XXB MM A-263TEST MODELRECORD 68297B/68397B3-9 Harmonic Test: RF Output Signals From 2 to 20 GHzTest Procedure (2 to 10 GHz)Measure Value Upp

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A-264 682XXB/683XXB MMTEST MODELRECORD 68297B/68397B3-10 Single Sideband Phase Noise TestTest ProcedureMeasured Value Upper LimitSet F1 to 0.6 GHzReco

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682XXB/683XXB MM A-265TEST MODELRECORD 68297B/68397B3-10 Single Sideband Phase Noise Test (Continued)Test ProcedureMeasured Value Upper LimitSet F1 to

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A-266 682XXB/683XXB MMTEST MODELRECORD 68297B/68397B3-11 Power Level Accuracy and Flatness Tests(Model 68297B/68397B)Power Level Accuracy Test Procedu

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682XXB/683XXB MM A-267TEST MODELRECORD 68297B/68397B3-12 Amplitude Modulation TestAM Imput Sensitivity ProcedureLower Limit Measured Value Upper Limit

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A-268 682XXB/683XXB MMTEST MODELRECORD 68297B/68397B3-14 Pulse Modulation Tests: Rise Time, Fall Time, Overshoot, and LevelRise Time, Fall Time, and O

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682XXB/683XXB MM A-269TEST MODELRECORD 68297B/68397B3-14 Pulse Modulation Tests: Rise Time, Fall Time, Overshoot, and Level (Continued)Pulse Level Acc

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A-270 682XXB/683XXB MMTEST MODELRECORD 68297B/68397B3-16 Pulse Modulation Test: RF On/Off RatioTest Procedure (1 GHz)Lower Limit Measured Value Upper

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ANRITSU Model 68297B/68397B Date: __________________________Serial Number __________________ Calibrated By: __________________________682XXB/683XXB MM

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When the 683XXB is generating broad-band analogfrequency sweeps (>100 MHz wide), the main tun-ing coil current tunes the oscillator through theswee

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A-272 682XXB/683XXB MMTEST MODELRECORD 68297B/68397B4-10 ALC Slope Calibration (68397B having Firmware Version 2.00 or above)Procedure StepStep Comple

Página 459 - 682XXB/683XXB MM A-221

682XXB/683XXB MM A-273TEST MODELRECORD 68297B/68397B4-13 FM Calibration (68297B/68397B with Firmware Version 1.01 to 2.10)Procedure StepStep Completio

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A-274 682XXB/683XXB MMTEST MODELRECORD 68297B/68397B4-14 Phase Modulation (FM) Calibration (Option 6)Procedure StepStep Completion1. External Wide M M

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Subject Index0 - 9682XXB/683XXBAssembly and Component Locator Diagram, 6-9General Description, 1-3Major Subsystems Functional Description, 2-3Manuals,

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NNormal Operation Error/Warning Messages, 5-7OOptions, List of, 1-7PParts and Subassemblies, Replaceable, 1-14Parts Ordering Information, 1-14ANRITSU

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coupler in the switched filter path of high powerswitched filter assemblies provides the RF signal forthe source quadrupler module (refer to Figure 2-

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amplified, and coupled out for use in internal level-ing. The detected RF sample is routed to the A10ALC PCB.The 0.01 to 2 GHz RF output from the down

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ters. PIN switch drive current is generated by inter-nal drivers that are controlled by signals receivedfrom the A12 Analog Instruction PCB. The switc

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FMMAINBIASModulatorControlSwitchControl>+17 dBm8.4-20 GHz2-8.4 GHz>+4dBm0.5 - 40 GHz110 dBStepAttenuator(Option)DirectionalCouplerControl3.3 GHz

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FMMAINBIASModulatorControlSwitchControl>+17 dB mPulse8.4-20 G H z2-8.4 G H z>+4dBm3.3 G H z LPF5.5 G H z LP F8.4 G H z LP F1 3 .5 G H z L P FL

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RF signal is amplified, then doubled in frequency.From the doubler, the 20 to 40 GHz RF signal isrouted by PIN switches to the bandpass filters.There

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60 GHz RF signal goes via a band-pass filter to theoutput connector of the SQM.From the SQM, the 40 to 60 GHz RF output signalgoes to input connector

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(for 682X5B/683X5B models) to adjust the RF out-put power level.StepAttenuatorThe optional step attenuator provides up to 110 dB(90 dB for 50 GHz and

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ALC/AM/Pulse Modulation...2-8RF Deck...2-8Power Supply...2-8Inputs/Outputs...2-8Motherboard/In

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Table of Contents3-1 INTRODUCTION...3-33-2 RECOMMENDED TEST EQUIPMENT ...3-33-3 TEST RECORDS ...3-33-4 CONNECTOR A

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3-11 POWER LEVEL TESTS...3-26Test Setup...3-26Power Level Accuracy Test Procedure...3-27Power Level Flatness Test Proce

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Chapter 3Performance Verification3-1 INTRODUCTION This chapter contains tests that can be used to verify the performanceof the Series 682XXB/683XXB Sy

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3-4 682XXB/683XXB MMINSTRUMENTCRITCALSPECIFICATIONRECOMMENDEDMANUFACTURER/MODELTESTNUMBERSpectrum Analyzer,withExternal MixersandDiplexer AssyFrequenc

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682XXB/683XXB MM 3-5INSTRUMENTCRITCALSPECIFICATIONRECOMMENDEDMANUFACTURER/MODELTESTNUMBERAdapter WR15 to V (male)Adapts the MP716A4 Power Sensor tothe

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3-5 682XXB/683XXB POWERLEVELSTable 3-2 is a listing of the Series 682XXB and 683XXB SynthesizedSignal Generator models and their maximum leveled ouput

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682XXB/683XXB MM 3-7PERFORMANCE 682XXB/683XXBVERIFICATION POWER LEVELS68XXXBModelFrequency(GHz)Max LeveledOutput PowerMax LeveledOutput Powerw/Step At

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3-6 INTERNAL TIME BASEAGING RATE TEST(Optional)The following test can be used to verify that the 682XXB/683XXB10 MHz time base is within its aging spe

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TestProcedureThe frequency error is measured at the start andfinish of the test time period of 24 hours. The agingrate is the difference between the t

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3-7 FREQUENCY SYNTHESIS TESTS...3-11Test Setup...3-11Coarse Loop/YIG Loop Test Procedure...3-12Fine Loop Test Procedure...

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4. Record the frequency error value, displayed onthe Frequency Reference, on the Test Record.5. Wait for 24 hours, then record the current fre-quency

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3-7 FREQUENCYSYNTHESIS TESTSThe following tests can be used to verify correct operation of the fre-quency synthesis circuits. Frequency synthesis test

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Coarse Loop/YIG Loop TestProcedureThe following procedure tests both the coarse loopand YIG loop by stepping the signal generatorthrough its full freq

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Fine LoopTestProcedureThe following procedure tests the fine loop by step-ping the instrument through ten 1 kHz steps (ten100 Hz steps for instruments

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3-8 SPURIOUS SIGNALSTEST: RF OUTPUTSIGNALS £2 GHz(£2.2 GHz for 68XX5BMODELS)The following test can be used to verify that the signal generatormeets it

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2. Set up the 682XXB/683XXB as follows:a.Reset the instrument by pressing SYSTEM ,then Reset . Upon reset the CW Menu is dis-played.b.Press Edit L1 to

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presence by entering their levels on the Test Re-cord.9. Set F1 to 1.6 GHz. Measure the worst case non-harmonic signal for the 1.6 GHz carrier and rec

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0.5 - 2.2 GHzTestProcedureThe following procedure lets you measure the 0.5 to2.2 GHz RF output harmonic levels to verify thatthey meet specifications.

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3-9 HARMONIC TEST: RFOUTPUT SIGNALS FROM2 TO 20 GHzThe following test can be used to verify that the 682XXB/683XXBmeets its harmonic specifications fo

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TestProcedure(2 to 10 GHz)The following procedure lets you measure the 2 to10 GHz (2.2 to 10 GHz for 68XX5Bs) RF output har-monic levels to verify tha

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3-16 PULSE MODULATION TEST: RF ON/OFF RATIO 3-45Test Setup...3-45Test Procedure...3-453-17 PHASE MODULATION TESTS...

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TestProcedure(11 to 20 GHz)The following procedure lets you measure the 11 to20 GHz RF output harmonic levels to verify thatthey meet specifications.N

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slightly to accomplish this; however, do not exceed–-20 dBm output power.4. Remove Connection A and connect the 682XXB/683XXB RF OUTPUT to the wavegui

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3-10 SINGLE SIDEBANDPHASE NOISE TESTThe following test can be used to verify that the signal generatormeets its single sideband phase noise specificat

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TestProcedureThe following procedure lets you measure the RFoutput single sideband phase noise levels to verifythat they meet specifications.NOTEThe f

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NOTEIf the 682XXB/683XXB LO output is lessthan 10 dBm, the Mixer’s local oscillatorportwillnotbe saturated andtheresultingmeasurements may be in error

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9. On the Spectrum Analyzer:a. Deselect NOISE LVL.b. Set Frequency Span to 300 kHz.c. Adjust the Marker for a 100 kHz offset.d. Select NOISE LVL.10. M

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3-11 POWER LEVELACCURACY ANDFLATNESS TESTSThe following tests can be used to verify that the 682XXB/683XXBmeets its power level specifications. Power

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Power LevelAccuracy TestProcedurePower level accuracy is tested by stepping the out-put power level down in 1 dB increments from itsmaximum rated powe

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c. With the Step Sweep Menu displayed, pressthe main menu keyFREQUENCYCONTROLThe Sweep Frequency Control Menu is thendisplayed.d.Press Full to select

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3. Set up the 683XXB as follows for an analog sweeppower level flatness test:a.Reset the instrument by pressing SYSTEM ,then Reset . The CW Menu is di

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4-12 AM CALIBRATION...4-33Equipment Setup...4-33AM Calibration Procedure...4-344-13 FM CALIBRATION...

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3-12 AMPLITUDEMODULATION TESTThis procedure verifies the operation of the 682XXB/683XXB ampli-tude modulation input sensitivity circuit.The RF OUTPUT

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AM InputSensitivityProcedureThe following procedure lets you measure the abso-lute peak AM values for a 50% AM signal and calcu-late the actual modula

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8. Compute the actual AM input sensitivity with thefollowing formula:%|()||(–)||()||(–)|AMAM PK AM PKAM PK AM PK=´++++-100200éëêùûú9. The calculated r

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3-13 FREQUENCYMODULATION TESTSThis procedure verifies the operation of the 682XXB/683XXB fre-quency modulation input sensitivity circuitry.The RF OUTP

Página 509 - 682XXB/683XXB MM A-271

Unlocked Wide FM Mode1. Set up the 682XXB/683XXB as follows:a.Reset the instrument by pressing SYSTEM ,then Reset . Upon reset, the CW Menu is dis-pla

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5. The difference between these two frequenciesis the actual peak-to-peak frequency deviation.It should be between 190 MHz and 210 MHz.Record the diff

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7. Compute the FM accuracy with the following for-mula:Accuracy inFM Deviation inkHz(%)()=æèçöø÷´2401008. The calculated result should be between 93.7

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6. Compute the FM accuracy with the following for-mula:Accuracy inFM Deviation inkHz(%)()=æèçöø÷´2401007. The calculated result should be between 93.7

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6. Compute the FM accuracy with the following for-mula:Accuracy inFM Deviation inkHz(%)()=æèçöø÷´2401007. The calculated result should be between 93.7

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3-14 PULSE MODULATIONTESTS: RISE TIME,FALL TIME, OVER-SHOOT, AND LEVELPulse modulation tests verify correct operation aswell as rise time, fall time,

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